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ASM Technical Books
Electronic Device Failure Analysis Technology Roadmap
By
Electronic Device Failure Analysis Society
Electronic Device Failure Analysis Society
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ASM International
ISBN electronic:
978-1-62708-462-8
Publication date:
2023
Book Chapter
Analog and Mixed Signals
-
Published:2023
Page range:
63 - 68
Abstract
This chapter sheds light on the challenges involved in diagnosing faults in analog, mixed-signal, and RF circuits. It describes some of the work being done to leverage the benefits of standardization, improve fault simulation tools, and overcome limitations on optical fault isolation techniques. One of the solutions being considered is to integrate LEDs throughout the analog circuit, thereby using light to report the status of internal signals.
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Citation
Tommaso Melis, Luc Saury, Analog and Mixed Signals, Electronic Device Failure Analysis Technology Roadmap, By Electronic Device Failure Analysis Society, ASM International, 2023, p 63–68, https://doi.org/10.31399/asm.tb.edfatr.t56090063
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