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Electronic Device Failure Analysis Technology Roadmap
By
Electronic Device Failure Analysis Society
Electronic Device Failure Analysis Society
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ASM International
ISBN electronic:
978-1-62708-462-8
Publication date:
2023
Book Chapter
Overview of Fault Isolation
By
Isolation Domain, Die-Level Roadmap Council
Isolation Domain, Die-Level Roadmap Council
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-
Published:2023
Page range:
1 - 2
Abstract
This chapter briefly lays out the challenges associated with electrical fault isolation (EFI) brought on by continued transistor scaling and increasing package complexity. It also identifies high-priority issues and areas of technology that must be addressed for EFI tools and techniques to remain effective.
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Citation
Isolation Domain, Die-Level Roadmap Council, Overview of Fault Isolation, Electronic Device Failure Analysis Technology Roadmap, By Electronic Device Failure Analysis Society, ASM International, 2023, p 1–2, https://doi.org/10.31399/asm.tb.edfatr.t56090001
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