Foreword

This ebook marks a step for the Electronic Device Failure Analysis Society (EDFAS) in establishing virtual content to fulfill its mandate of supporting interdisciplinary scientific and technical knowledge sharing in the growing electronics failure analysis community. The ebook model is an innovative publishing approach from ASM specifically designed to capture up-to-date and in-depth technical content in our rapidly innovating microelectronics industry. This new venture from ASM publications is in synergy with the EDFAS Board initiative to complement the three traditional information source pillars: the International Symposium for Testing and Failure Analysis (ISTFA) conference, the Microelectronics Failure Analysis Desk Reference, and the EDFA magazine.

The authors of this ebook first presented the material during a tutorial at the ISTFA in November 2019 in Portland, Oregon, USA. Tutorials at ISTFA help introduce topics and concepts to people new to the field or to someone starting into that new specific area of electronic failure analysis. The content included in this ebook covers the fundamentals of scanning transmission electron microscopy in a scanning electron microscope (STEM-in-SEM), complementing the tutorial presentation slides available in the ISTFA 2019 tutorial slides proceeding.

I think you will find the information useful and the format easy to use. Send me a message at felix.beaudoin@globalfoundries.com and let us know.