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Jason D. Holm, National Institute of Standards and Technology
Benjamin W. Caplins, National Institute of Standards and Technology

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ASM International staff who worked on this project include Vicki Burt, Managing Editor; Joanne Miller, Senior Editor, Magazines and Digital Media; Scott Henry, Senior Content Engineer; Karen Marken, Senior Managing Editor; Madrid Tramble, Manager of Production; and Larry Berardinis, Technology Projects Manager.

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Subject: STEM in SEMIntroduction to Scanning Transmission Electron Microscopy for Microelectronics Failure Analysis > Credits

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STEM in SEM: Introduction to Scanning Transmission Electron Microscopy for Microelectronics Failure Analysis

ASM International

ISBN electronic:

978-1-62708-292-1

Publication date:

2020

Credits

Authors

Staff

Contents

STEM in SEM: Introduction to Scanning Transmission Electron Microscopy for Microelectronics Failure Analysis

Product Catalog

Data & Figures

References

Credits

Authors

Staff

Send Email

Contents

STEM in SEM: Introduction to Scanning Transmission Electron Microscopy for Microelectronics Failure Analysis

Product Catalog

Data & Figures

References

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