This article is a compilation of terms and definitions related to failure analysis that have been addressed in the proceedings of the International Symposium for Testing and Failure Analysis.
Christopher L. Henderson, Failure Analysis Terms and Definitions, Microelectronics Failure Analysis: Desk Reference, 7th ed., Edited By Tejinder Gandhi, ASM International, 2019, p 678–694, https://doi.org/10.31399/asm.tb.mfadr7.t91110678
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