Skip to Main Content
Umbrella Alt Text
Search
Advanced Search
Search ASM
Toggle MenuMenu
Skip Nav Destination
Microelectronics Failure Analysis: Desk Reference (Seventh Edition)
ASM Technical Books

Microelectronics Failure Analysis: Desk Reference (Seventh Edition)

Edited by
Tejinder Gandhi
Tejinder Gandhi
Search for other works by this author on:
This Site
Google Scholar
ASM International
DOI:
https://doi.org/10.31399/asm.mfadr7.9781627082471
ISBN electronic:
978-1-62708-247-1
Publication date:
2019
Book Chapter

Failure Analysis Terms and Definitions

By
Christopher L. Henderson
Christopher L. Henderson
Semitracks Inc.
Search for other works by this author on:
This Site
Google Scholar
Doi:
https://doi.org/10.31399/asm.tb.mfadr7.t91110678
  • Published:
    2019

Abstract

This article is a compilation of terms and definitions related to failure analysis that have been addressed in the proceedings of the International Symposium for Testing and Failure Analysis.

Topics
Failure mechanisms and analysis
You do not currently have access to this chapter.
Don't already have an account? Register
Citation

Christopher L. Henderson, Failure Analysis Terms and Definitions, Microelectronics Failure Analysis: Desk Reference, 7th ed., Edited By Tejinder Gandhi, ASM International, 2019, p 678–694, https://doi.org/10.31399/asm.tb.mfadr7.t91110678

Download citation file:

  • ASM International
  • 9639 Kinsman Road
  • Materials Park, OH 44073-0002
Close Modal
This Feature Is Available To Subscribers Only

or Create an Account

Close Modal
Close Modal
This site uses cookies. By continuing to use our website, you are agreeing to our privacy policy.
Accept