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Microelectronics Failure Analysis: Desk Reference (Seventh Edition)
ASM Technical Books

Microelectronics Failure Analysis: Desk Reference (Seventh Edition)

Edited by
Tejinder Gandhi
Tejinder Gandhi
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ASM International
DOI:
https://doi.org/10.31399/asm.mfadr7.9781627082471
ISBN electronic:
978-1-62708-247-1
Publication date:
2019
Book Chapter

Failure Analysis Terms and Definitions

By
Christopher L. Henderson
Christopher L. Henderson
Semitracks Inc.
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Doi:
https://doi.org/10.31399/asm.tb.mfadr7.t91110678
  • Published:
    2019

Abstract

This article is a compilation of terms and definitions related to failure analysis that have been addressed in the proceedings of the International Symposium for Testing and Failure Analysis.

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Citation

Christopher L. Henderson, Failure Analysis Terms and Definitions, Microelectronics Failure Analysis: Desk Reference, 7th ed., Edited By Tejinder Gandhi, ASM International, 2019, p 678–694, https://doi.org/10.31399/asm.tb.mfadr7.t91110678

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