Skip to Main Content
Skip Nav Destination


This article is a compilation of terms and definitions related to failure analysis that have been addressed in the proceedings of the International Symposium for Testing and Failure Analysis.

You do not currently have access to this chapter.
Don't already have an account? Register

Christopher L. Henderson, Failure Analysis Terms and Definitions, Microelectronics Failure Analysis: Desk Reference, 7th ed., Edited By Tejinder Gandhi, ASM International, 2019, p 678–694,

Download citation file:

Close Modal

or Create an Account

Close Modal
Close Modal