Diagnosis of Scan Logic and Diagnosis Driven Failure Analysis
In this overview of diagnosis of scan logic and diagnosis driven failure analysis, the authors explore the world of diagnosis of digital semiconductors devices. After shortly outlining the technology behind diagnosis, the main part of this article describes key improvements to the basic diagnosis tools, discussing their merits for the failure analysis engineer. The article also describes the various requirements and other considerations that typically need to be taken into account to set up a full working scan diagnosis system. It summarizes the principles of design with embedded compression technologies. Finally, several successful industrial applications of diagnosis are presented.
Srikanth Venkataraman, Martin Keim, Geir Eide, Diagnosis of Scan Logic and Diagnosis Driven Failure Analysis, Microelectronics Failure Analysis: Desk Reference, 7th ed., Edited By Tejinder Gandhi, ASM International, 2019, p 101–110, https://doi.org/10.31399/asm.tb.mfadr7.t91110101
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