This article covers common techniques for surface characterization, including the modern scanning electron microscopy and methods for the chemical characterization of surfaces by Auger electron spectroscopy, X-ray photoelectron spectroscopy, and time-of-flight secondary ion mass spectrometry. The principles of surface analysis and some of the applications of the technique in polymer failure studies are also provided.
Surface Analysis, Characterization and Failure Analysis of Plastics, Edited By Steven Lampman, ASM International, 2003, p 383–403, https://doi.org/10.31399/asm.tb.cfap.t69780383
Download citation file:
FALL / WINTER 2020 CATALOG
View the new, upcoming, and best-selling resources in ASM Handbooks, technical books, and databases in the Fall / Winter 2020 Catalog.