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Authors

  • Jason D. Holm, National Institute of Standards and Technology

  • Benjamin W. Caplins, National Institute of Standards and Technology

Staff

ASM International staff who worked on this project include Vicki Burt, Managing Editor; Joanne Miller, Senior Editor, Magazines and Digital Media; Scott Henry, Senior Content Engineer; Karen Marken, Senior Managing Editor; Madrid Tramble, Manager of Production; and Larry Berardinis, Technology Projects Manager.

2020. "Credits", STEM in SEM: Introduction to Scanning Transmission Electron Microscopy for Microelectronics Failure Analysis, Jason D. Holm, Benjamin W. Caplins

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Subject: STEM in SEMIntroduction to Scanning Transmission Electron Microscopy for Microelectronics Failure Analysis > Credits

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