This article provides a detailed account of the concepts of single-crystal x-ray diffraction (XRD). It begins with a historical review of XRD methods, followed by a description of the various factors involved in crystal symmetry. The article then focuses on the phase problem in x-ray structural analysis and validation of the structural model. Some of the factors to be considered for performing experimental procedure are provided. The article presents several examples of applications of single-crystal XRD. The following sections cover the crystallographic problem in terms of structural analysis, software programs for crystal structure solution and refinement, and visualization of crystal structures. The article ends with a discussion on various databases available for single-crystal XRD analysis.
Vladislav V. Gurzhiy, Single-Crystal X-Ray Diffraction, Materials Characterization, Vol 10, 2019 ed., ASM Handbook, ASM International, 2019, p 414–426, https://doi.org/10.31399/asm.hb.v10.a0006631
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