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Xiaocui Li
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Proceedings Papers
ISTFA2015, ISTFA 2015: Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis, 31-34, November 1–5, 2015,
Abstract
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It is difficult to localize the soft defect on analog and mixed-signal ICs only by OBIRCH, because OBIRCH laser scanning module could not synchronize with the IC under functional test, and the failure modes on analog and mixed-signal ICs are complicated. In this paper, a dynamic synchronization method is proposed to localize the soft defect precisely only with an OBIRCH tool on analog and mixed-signal ICs. The methodology and system configuration are presented. A case is studied successfully on an analog and mixed-signal IC using this method.
