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Winson Lua
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Journal Articles
Journal: EDFA Technical Articles
EDFA Technical Articles (2018) 20 (2): 10–16.
Published: 01 May 2018
Abstract
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This article explains how laser voltage probing (LVP) can be used to analyze combinational logic circuits. The authors describe how the technique is aided by the development and use of a waveform library and a corresponding truth table. They also present a case study in which the new technique is used to isolate faults in a combinational logic circuit consisting of multiple gates.
Proceedings Papers
ISTFA2015, ISTFA 2015: Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis, 35-41, November 1–5, 2015,
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Laser Voltage Probing (LVP) using continuous-wave near infra-red lasers are popular for failure analysis, design and test debug. LVP waveforms provide information on the logic state of the circuitry. This paper aims to explain the waveforms observed from combinational circuitries and use it to rebuild the truth table.
