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W.W. Gerberich
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Proceedings Papers
ITSC 2006, Thermal Spray 2006: Proceedings from the International Thermal Spray Conference, 453-458, May 15–18, 2006,
Abstract
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Stresses developed within a thermal barrier coating (TBC) due to the mismatch in thermal expansion of different coating components can cause coating failure. Nanostructured materials have an increased volume fraction of grain boundaries and this microstructural attribute may allow coatings to relieve the strain in the coating structure thereby improving the effectiveness and the lifetime of the TBC. Multi – layered TBCs were prepared using two techniques; atmospheric pressure plasma spray (APS) using a commercial system, and reduced pressure plasma spray using the Triple Torch Plasma Reactor (TTPR). The coatings were deposited on mullite and on NiCrAlY-coated steel substrates, and consisted of an inter – layer of nano-phase partially stabilized zirconia (n – PSZ) and a layer of conventional partially yttria stabilized zirconia coating (c – YSZ) as the top thermal barrier coat. The coatings were heat treated at various temperatures and the microstructural changes analyzed using scanning electron microscopy (SEM) images. Mechanical properties of the coating were studied using four point bend testing to better understand the effect of the n-PSZ inter-layer on the strain relief mechanisms that may be operative within the TBC.
Series: ASM Handbook
Volume: 8
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.hb.v08.a0003309
EISBN: 978-1-62708-176-4
Abstract
This article describes the types, mechanism, and typical test methods along with their configurations for the evaluation of hydrogen embrittlement, stress-corrosion cracking, and corrosion fatigue with an emphasis on fracture mechanics methodologies for metals. An overview on the environmentally assisted crack growth of polymers is also included. The article details the evaluation of nanoscale environmental effects and indentation-induced cohesive cracking. It also provides information on scanning probe microscopy.