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Venkat Krishnan Ravikumar
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Book Chapter

Laser-Based, Photon, and Thermal Emission

By Venkat Krishnan Ravikumar, Kristofor Dickson, Christian Boit
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090003
EISBN: 978-1-62708-462-8
Abstract
This chapter assesses the capabilities and limitations of electric fault isolation (EFI) technology, the measurement challenges associated with new device architectures, and the pathways for improvement in emission microscopy, laser stimulation, and optical probing. It also assesses the factors that influence signal strength, spatial and timing resolution, and alignment accuracy between signal response images and the physical layout of the IC.
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Journal Articles

Combinational Logic Analysis with Laser Voltage Probing

Venkat Krishnan Ravikumar, Winson Lua, Gopinath Ranganathan, Angeline Phoa
Journal: EDFA Technical Articles
EDFA Technical Articles (2018) 20 (2): 10–16.
DOI: https://doi.org/10.31399/asm.edfa.2018-2.p010
Published: 01 May 2018
Abstract
This article explains how laser voltage probing (LVP) can be used to analyze combinational logic circuits. The authors describe how the technique is aided by the development and use of a waveform library and a corresponding truth table. They also present a case study in which the new technique is used to isolate faults in a combinational logic circuit consisting of multiple gates.
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Proceedings Papers

Combinational Logic Analysis Using Laser Voltage Probing

Venkat Krishnan Ravikumar, Winson Lua, Seah Yi Xuan, Gopinath Ranganathan, Angeline Phoa
ISTFA2015, ISTFA 2015: Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis, 35-41, November 1–5, 2015,
https://doi.org/10.31399/asm.cp.istfa2015p0035
Abstract
Laser Voltage Probing (LVP) using continuous-wave near infra-red lasers are popular for failure analysis, design and test debug. LVP waveforms provide information on the logic state of the circuitry. This paper aims to explain the waveforms observed from combinational circuitries and use it to rebuild the truth table.
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Proceedings Papers

Continuous-Wave 1064 nm Laser for Laser Voltage Imaging and Probing Applications

Venkat-Krishnan Ravikumar, Angeline Phoa, Prasad Sabbineni, Dmitry Skvortsov, Ted Lundquist
ISTFA2014, ISTFA 2014: Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis, 335-339, November 9–13, 2014,
https://doi.org/10.31399/asm.cp.istfa2014p0335
Abstract
Laser-voltage probing (LVP) and imaging (LVI) using a continuous-wave (CW) 1320-1340nm laser have become mainstream techniques for electrical fault isolation. A 1064nm laser with a 20% shorter wavelength offers immediate resolution advantages compared to 1320nm at a cost of increased intrusion. This paper explores the potential of CW 1064nm laser and identifies opportunities in fault isolation
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