The intent of this paper is to present several case studies that highlight different analytical methods used to isolate short circuits within Circuit Card Assemblies (CCAs). When working with CCAs, each investigation may present its own unique challenges that can be solved utilizing a diverse toolset. This toolset does not just include test equipment but rather a catalog of methodologies and processes, which is learned through experience while leveraging how others have approached similar problems.

Time Domain Reflectometry (TDR) is an analysis technique for characterizing a transmission environment (PCB traces, cable assemblies, etc.) and identifying the physical location of defects or impedance discontinuities which can quickly narrow the focus of an investigation. This paper introduces the capability and presents several case studies spanning different applications where TDR was useful as a non-destructive analysis technique.