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S.V. Nguyen
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Journal Articles
Journal: EDFA Technical Articles
EDFA Technical Articles (2017) 19 (2): 10–20.
Published: 01 May 2017
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Positron spectroscopy can identify defects deep within metals and semiconductors with a resolution better than a single atomic lattice site. This article discusses the basic principles and implementation of positron annihilation spectroscopy and a key development that makes it more a more useful tool for semiconductor applications.