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Michael Obein
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Journal Articles
Journal: EDFA Technical Articles
EDFA Technical Articles (2018) 20 (4): 30–36.
Published: 01 November 2018
Abstract
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Copper wires are susceptible to damage during acid decapsulation and must be protected by stopping the process at the right moment. This article describes the development and evaluation of a method that uses polarization current measurements for end-of-etch detection and subsequent rinse.
Proceedings Papers
ISTFA2015, ISTFA 2015: Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis, 474-479, November 1–5, 2015,
Abstract
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LASER techniques are widely used for pre-opening in combination with a final manual or automated wet chemistry decapsulation. Even if most of the ICs may be opened today, and if opening the recently introduced Ag wires packages have been solved with novel chemical recipes, the need for a greener and safer solution is still there. Plasma techniques combined with LASER can be a promising solution to these challenges. In this paper, after a presentation of the state of the art of the different techniques available in laboratories nowadays, the latest solution combining LASER and acid or plasma etching is presented. The paper compares the results obtained with these solutions on Cu an Ag wires devices with pros and cons for each solution. The results presented show the benefits, the constraints and the limitations of each technique regarding the different types of wires used in industry.
Proceedings Papers
ISTFA2014, ISTFA 2014: Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis, 87-93, November 9–13, 2014,
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The introduction of silver as bonding material led to new failure analysis issues. This study compares the efficiency of wet and dry chemistries for decapsulation on Cu and Ag-based alloy wires. It is shown that dry chemistry allows better control and selectivity on the EMC/ Cu and Ag-based bond wires.
Proceedings Papers
ISTFA2011, ISTFA 2011: Conference Proceedings from the 37th International Symposium for Testing and Failure Analysis, 248-255, November 13–17, 2011,
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IC packages have been greatly improved over the past several years. With the adoption of Cu wires and new green EMC (Epoxy Molding Compound), the suppression of lead, the use of Cu pillars and the increased number of dies, the verification of the quality of the assembly and failure analysis becomes critical. Starting twelve years ago, LASER ablation was introduced as a means to facilitate the pre-decapsulation of packages aiming at a completion by wet chemistry (acids) or dry chemistry (plasma). The decapsulation process with acid at medium temperature (75°C) does not permit to keep the Cu wires intact. Our studies and work in the past several years has consisted in lowering the temperature of acid use in order to minimize the effect of acid attack on the Al pads and Cu wires. Currently the thinnest wires used are 0.6 mil in diameter (approximately 15 μm). In this article we will demonstrate that decapsulations at sub-ambient temperatures are now possible and give expected results. Moreover, openings at near ambient temperature reduce the component deformation and also the deformation of its constituents compared to decapsulations at medium or high temperature.