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John Keane
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Proceedings Papers
ISTFA2015, ISTFA 2015: Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis, 21-24, November 1–5, 2015,
Abstract
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A laser based logic state imaging (LLSI) by activating transient voltage collapse (TVC) circuits of SRAM blocks is demonstrated. In order to induce a voltage modulation on a power rail, significant numbers of TVC units are activated. The image quality of LLSI strongly depends on a number of activated TVC circuits. From this experiment, it is concluded that an additional circuit or experimental setup is not necessary for LLSI.