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John Bartlett
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Proceedings Papers
Characterization of a Resistive Path to a Gate Node Using Tunneling Current Measurements
Available to Purchase
ISTFA2010, ISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis, 409-412, November 14–18, 2010,
Abstract
View Papertitled, Characterization of a Resistive Path to a Gate Node Using Tunneling Current Measurements
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for content titled, Characterization of a Resistive Path to a Gate Node Using Tunneling Current Measurements
Advanced technologies with higher gate leakage due to oxide tunneling current enable detection of high resistance faults to gate nodes using a straight forward resistance measurement.
