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Jer O’Sullivan
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Proceedings Papers
Electrostatic Force Microscopy Technique for Understanding Failures in Polyimide Insulation Barriers
ISTFA2024, ISTFA 2024: Conference Proceedings from the 50th International Symposium for Testing and Failure Analysis, 460-462, October 28–November 1, 2024,
Abstract
View Papertitled, Electrostatic Force Microscopy Technique for Understanding Failures in Polyimide Insulation Barriers
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for content titled, Electrostatic Force Microscopy Technique for Understanding Failures in Polyimide Insulation Barriers
Inductive coupling devices have emerged as superior alternatives to traditional optocouplers, offering improved performance, smaller size, and lower power consumption. However, these devices rely critically on a polyimide isolation barrier that can fail through high-voltage breakdown at its edges. We present a systematic study using electrostatic force microscopy to characterize charge injection and dissipation behavior in polyimide layers of varying thicknesses under different DC bias conditions. By correlating charge injection characteristics and dissipation times with layer thickness, we establish optimal barrier specifications to minimize product-level failures. This analysis provides crucial guidance for polyimide barrier design in inductive coupling applications.
Proceedings Papers
ISTFA2023, ISTFA 2023: Conference Proceedings from the 49th International Symposium for Testing and Failure Analysis, 249-252, November 12–16, 2023,
Abstract
View Papertitled, Magneto-Optic Kerr Imaging Technique for Localizing Magnetic Failures
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for content titled, Magneto-Optic Kerr Imaging Technique for Localizing Magnetic Failures
The paper describes the Magneto-Optic Kerr (MOKE) Imaging technique for imaging magnetic response of soft magnetic materials at external magnetic field. This method can be applied for investigating domain wall formations and propagation, localizing magnetic failing sites, and analyzing hysteresis response of the films at varying magnetic field strengths. The paper describes some use cases of this technique for failure analysis in magnetic sensors, whereby in some cases delayering have been developed prior to imaging.