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Proceedings Papers

Combining Time Resolved Emission and Analog Simulation for Fault Localization

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Christian Burmer, Fabian Hopsch, Wolfgang Vermeiren
ISTFA2010, ISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis, 384-388, November 14–18, 2010,
https://doi.org/10.31399/asm.cp.istfa2010p0384
Abstract
In this paper, we describe a fault localization strategy for scan designs based on Time Resolved Photon Emission (TRE) and analog simulation. After characterizing the defect’s electrical footprint using TRE, analog fault simulation is applied. A user - friendly software package with an easy to use interface to scan diagnosis, layout tool and simulator was created.
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