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1-2 of 2
Dmitry Skvortsov
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Proceedings Papers
ISTFA2014, ISTFA 2014: Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis, 335-339, November 9–13, 2014,
Abstract
View Papertitled, Continuous-Wave 1064 nm Laser for Laser Voltage Imaging and Probing Applications
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PDF
for content titled, Continuous-Wave 1064 nm Laser for Laser Voltage Imaging and Probing Applications
Laser-voltage probing (LVP) and imaging (LVI) using a continuous-wave (CW) 1320-1340nm laser have become mainstream techniques for electrical fault isolation. A 1064nm laser with a 20% shorter wavelength offers immediate resolution advantages compared to 1320nm at a cost of increased intrusion. This paper explores the potential of CW 1064nm laser and identifies opportunities in fault isolation
Proceedings Papers
ISTFA2010, ISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis, 5-13, November 14–18, 2010,
Abstract
View Papertitled, Laser Voltage Imaging: A New Perspective of Laser Voltage Probing
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for content titled, Laser Voltage Imaging: A New Perspective of Laser Voltage Probing
Laser Voltage Imaging (LVI) is a new application developed from Laser Voltage Probing (LVP). Most LVP applications have focused on design debug or design characterization, and are seldom used for global functional failure analysis. LVI enables the failure analysis engineer to utilize laser probing techniques in the failure analysis realm. In this paper, we present LVI as an emerging FA technique. We will discuss setting up an LVI acquisition and present its current challenges. Finally, we will present an LVI application in the form of a case study.
