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Proceedings Papers

In-Situ-Diagnostik bei Verfahren des thermischen Beschichtens – Particle Flux Imaging (PFI) (In-Situ Diagnostic Related to the Process of Thermal Coating – Particle Flux Imaging (PFI))

J. Zierhut, K. Landes, C. Waas, D. Kutscher, P. Heinrich ...
ITSC1999, Thermal Spray 1999: Proceedings from the United Thermal Spray Conference, 340-344, March 17–19, 1999,
https://doi.org/10.31399/asm.cp.itsc1999p0340
Abstract
The quality and the deposition efficiency of coatings produced in thermal spraying processes are influenced by many parameters. Therefore normally the process optimization is laborious and time consuming. To reduce these efforts the low cost In-situ diagnostic method PFI was developed. A stationary CCD camera records the radiation of the hot propellant carrier-medium and of the luminous particle flux. A connected PC immediately converts the brightness distributions to a false colour image corresponding to the temperature and density profiles of the carrier-medium and of the particle flux. Utilizing a reference image the parameters can be adjusted for a prompt and successful optimization of the spray process. The performance of the PFI- method is demonstrated in some examples. Paper text in German.
View Papertitled, In-Situ-Diagnostik bei Verfahren des thermischen Beschichtens – Particle Flux Imaging (PFI) (In-Situ Diagnostic Related to the Process of Thermal Coating – Particle Flux Imaging (PFI)) View PDF for content titled, In-Situ-Diagnostik bei Verfahren des thermischen Beschichtens – Particle Flux Imaging (PFI) (In-Situ Diagnostic Related to the Process of Thermal Coating – Particle Flux Imaging (PFI))