Abstract This paper aims to characterize with innovative methods bond coat and yttria partially stabilized zirconia powder and coating. Bond coat layers realized with different deposition techniques were anlyzed by X-ray Photoelectron Spectroscopy (XPS) in order to compare deposition technologies from the point of view of the oxide presence. X-ray diffraction and Raman microscopy were performed in order to determine the crystallographic composition of Yttria Partially Stabilized Zirconia powders and top coat layers. The surface and interface roughness is expected to affect spallation resistance of the thermally grown aluminum oxide and the life of thermal barrier coating. Raman microscopy allow to map the surface of the examined samples, retrieving the monoclinic zirconia distribution with high spatial resolution. XPS measurements were carried out in order to determine the surface elemental composition. This turns to be useful to measure the amount of oxides which forms during the spraying process and the thermal treatment. Paper includes a German-language abstract.