Abstract This paper aims to characterize with innovative methods bond coat and yttria partially stabilized zirconia powder and coating. Bond coat layers realized with different deposition techniques were anlyzed by X-ray Photoelectron Spectroscopy (XPS) in order to compare deposition technologies from the point of view of the oxide presence. X-ray diffraction and Raman microscopy were performed in order to determine the crystallographic composition of Yttria Partially Stabilized Zirconia powders and top coat layers. The surface and interface roughness is expected to affect spallation resistance of the thermally grown aluminum oxide and the life of thermal barrier coating. Raman microscopy allow to map the surface of the examined samples, retrieving the monoclinic zirconia distribution with high spatial resolution. XPS measurements were carried out in order to determine the surface elemental composition. This turns to be useful to measure the amount of oxides which forms during the spraying process and the thermal treatment. Paper includes a German-language abstract.

Abstract In this paper, different methods for surface preparation are investigated before the MCrAlY adhesive layer is applied. Surface characteristics are analyzed and the adhesive layer is applied to surfaces consisting of nickel-alloyed superalloys using the low-pressure plasma spraying process. Various preparation processes are taken into account: dry and wet blasting with corundum, dry blasting with silicon carbides, and cryogenic cleaning with carbon dioxide. The properties of the nickel-base substrate surface before and after the preparation measures are examined from the point of view of the surface roughness morphology and hardness near the surface. The properties of the adhesive layer in the layer system are determined. These are determined by adhesion tests on the substrate and layer system by means of scratch tests and the LESAGE-CHICOT method. The layer thicknesses and the layer structure are determined by metallographic analyzes. The microhardness in the area of the layer and substrate is measured. Paper includes a German-language abstract.