Phase stability of the thermal barrier deposits made from yttria-partially-stabilized zirconia (Y-PSZ) is a requirement for extended service lifetime. The response of Y-PSZ plasma-sprayed deposits to annealing at 1000 °C, 1200 °C, and 1400 °C with times from 1 to 1000 hours has been evaluated using Rietveld analysis of neutron diffraction data. Results show that yttria concentration of the as-sprayed tetragonal zirconia component generally decreased with increasing annealing temperature and time. As the yttria content in the tetragonal phase approached a limiting concentration, the tetragonal phase transformed into monoclinic phase on cooling. An increase in monoclinic phase content was clearly observable after annealing 24 hours at 1400 °C and was nearly 35 % after 100 hours at 1400 °C. A similar trend was observed at 1200 °C for longer annealing times, with monoclinic phase formation beginning after 400 hours. At 1000 °C experimental times were not sufficient for monoclinic phase to form although a decrease in the yttria concentration in the tetragonal phase was observed. Keywords: neutron scattering, yttria-stabilized zirconia, phase composition, Rietveld analysis

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