The influence of alumina substrate temperature and phase structure : columnar gamma phase, columnar alpha phase and granular alpha phase on splat formation and crystal growth has been studied by SEM and Atomic Force Microscopy. X Ray Diffraction at low angle has allowed to obtain informations on phase structure of layered splats according to substrate phase structure and coating thickness. Column sizes of splats are correlated to a ID model of splat cooling showing the influence of substrate thermal properties and splat thickness on crystal growth kinetic. Finally, coatings adhesion-cohesion values function of spraying parameters are in good agreement with splat morphology and microstructural evolution.

alumina, atomic force microscopy, crystal growth, instructional design model, microstructural evolution, phase structure, plasma spraying, scanning electron microscopy, thermal properties, X-ray diffraction
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Copyright © 1996 ASM International. All rights reserved.
1996
ASM International
Topics
Microstructural analysis Plasma spray coating Scanning electron microscopy Atomic force microscopy Thermal properties X-ray diffraction Crystal growth
Issue Section:
Microstructural Characterization and Properties
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