Abstract
This paper demonstrates the use of emission spectroscopy for monitoring trace impurities in plasma and flame sprayed layers during deposition. It describes the working principles of the method and presents and analyzes different spraying scenarios where small amounts of certain impurities can have a major consequence if not detected. Paper includes a German-language abstract.
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Copyright © 2002 Verlag für Schweißen und verwandte Verfahren DVS-Verlag GmbH. All rights reserved.
2002
Verlag für Schweißen und verwandte Verfahren DVS-Verlag GmbH
Issue Section:
Poster Session: Quality Control and Assurance
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