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user-defined fault model

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Proceedings Papers

ISTFA2021, ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, 369-376, October 31–November 4, 2021,
...Abstract Abstract This paper presents a user-defined fault model (UDFM) that accounts for silicon behaviors that cannot be explained using traditional stuck-at and transition delay fault models. The new model targets cell-internal faults but does not require time-intensive SPICE simulations...
Proceedings Papers

ISTFA2017, ISTFA 2017: Conference Proceedings from the 43rd International Symposium for Testing and Failure Analysis, 526-537, November 5–9, 2017,
... bridging, user defined fault model (udfm) or cell test modules (ctm) In designs where compression is used, these set of files are needed for both the compressed and bypass (uncompressed) designs. The ATPG-ready archive of the design allows the failure analyst to read in the design and be able to write out...
Proceedings Papers

ISTFA2020, ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis, 335-337, November 15–19, 2020,
... Introduction For enabling cell aware diagnosis, a user defined fault model (UDFM) is required per each standard cell used in the design [2]. Before we delve into the UDFM generation and cell aware diagnosis, a brief description of layout aware diagnosis and the UDFM itself for the 14nm customer chip...
Proceedings Papers

ISTFA2014, ISTFA 2014: Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis, 528-532, November 9–13, 2014,
... of ATPG model. Also, this method targets coverage based on traditional fault models and may not consider unique functionality associated with a specific architecture. Another, more customizable option is the application of user defined patterns via the ATPG infrastructure. In this way, specific algorithms...
Proceedings Papers

ISTFA2021, ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, 377-387, October 31–November 4, 2021,
...: Starting with the same set of files used during layout-aware ATPG diagnosis, the diagnosis option was set to cell_faults and the user-defined fault model (UDFM) was additionally read into the ATPG tool. Cell-aware (CA) diagnosis [6][7] was performed and the results are summarized in Table 6. Table 6. Cell...
Proceedings Papers

ISTFA2010, ISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis, 384-388, November 14–18, 2010,
...Abstract Abstract In this paper, we describe a fault localization strategy for scan designs based on Time Resolved Photon Emission (TRE) and analog simulation. After characterizing the defect’s electrical footprint using TRE, analog fault simulation is applied. A user - friendly software...
Proceedings Papers

ISTFA2021, ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, 1-5, October 31–November 4, 2021,
... and the Computer, pp. 59-69, 2017. [2] M. E. Prieto, V. H. Menéndez, A. A. Segura and C. Vidal, "A Recommender System Architecture for Instructional Engineering," in Emerging Technologies and Information Systems for the Knowledge Society, 2008. [3] A. Følstad, C. B. Nordheim and C. A. Bjørkli, "What Makes Users...
Proceedings Papers

ISTFA2006, ISTFA 2006: Conference Proceedings from the 32nd International Symposium for Testing and Failure Analysis, 26-29, November 12–16, 2006,
... on. The No POST boards prevented end user PCs from booting to Windows. And the No LAN boards prevented end user PCs from making a network connection. The impact of No Power failures was significantly more than the other two categories, hence became the major focus area. Failure Analysis/Fault Isolation FA/FI...
Proceedings Papers

ISTFA2004, ISTFA 2004: Conference Proceedings from the 30th International Symposium for Testing and Failure Analysis, 181-190, November 14–18, 2004,
... polygons for each wire on each layer are computed, and compared against a limit to determine if the wires are neighbors. GDSII/netlist databases are also queried for the list of layers and locations on which the wires are neighbors for reporting to the user. If the result of the proximity lookup is true...
Proceedings Papers

ISTFA2020, ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis, 91-99, November 15–19, 2020,
... the universal defect injection, simulating one fault at a time. In the end the result is summarized reporting all the simulations which output met the fault criteria range defined by the user. Fault models For digital circuits, defect diagnosis and test methodologies are relatively mature and have been...
Proceedings Papers

ISTFA2004, ISTFA 2004: Conference Proceedings from the 30th International Symposium for Testing and Failure Analysis, 126-133, November 14–18, 2004,
... control SW, test patterns, and end-user applications. For Step 2 (fault characterization), the tool set supports engineering test analysis. These tools should emphasize functional analysis, timing analysis, parametric analysis, and engineering productivity. Optimal tools are both equipment- and software...
Proceedings Papers

ISTFA2021, ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, 108-114, October 31–November 4, 2021,
... to monitor license and application usage. Withholding critical or sensitive design blocks and select layers achieves 100% mitigation of risking exposed IP. Furthermore, user-defined annotations in the form of CAD virtual layers can be bundled in the export to communicate precise instructions of the FA...
Proceedings Papers

ISTFA1996, ISTFA 1996: Conference Proceedings from the 22nd International Symposium for Testing and Failure Analysis, 109-114, November 18–22, 1996,
... up to this step. (In order to simulate the process steps, it uses built-in step models. However, user-defined models can also be added to CODEF and used if required.) The particle is then placed on the IC cell surface at the appropriate location. Process Description (PREDITOR) Layout Description (CIF...
Proceedings Papers

ISTFA2015, ISTFA 2015: Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis, 349-357, November 1–5, 2015,
... avoids the need to create a fault dictionary for the whole product. [14]. Able to open various tools while keeping hierarchy alignment, the user can launch an intracell diagnosis option tool based on critical path tracing allowing diagnosis inside the cells. Figure 6a :Intracell diagnosis flow...
Proceedings Papers

ISTFA2017, ISTFA 2017: Conference Proceedings from the 43rd International Symposium for Testing and Failure Analysis, 544-549, November 5–9, 2017,
... data mining methods have been published recently. Model-based volume diagnosis (MVD)[11] assumes user- defined failure feature and utilizes simplified single root cause model that defects are on metal layer. Experiment defect screening (EDS)[12] requires a method to first differentiate the target wafer...
Proceedings Papers

ISTFA2002, ISTFA 2002: Conference Proceedings from the 28th International Symposium for Testing and Failure Analysis, 609-615, November 3–7, 2002,
... at that time. This requires an assessment of the user s environment and details of the user s and product technical support s action. Based on this information, a defined Design of Experiments (DOE) can be developed that duplicates the failure event and supplies the necessary clue to what triggered the failure...
Proceedings Papers

ISTFA2021, ISTFA 2021: Tutorial Presentations from the 47th International Symposium for Testing and Failure Analysis, m1-m34, October 31–November 4, 2021,
... Reserved 16 Auto Delayering Workflow User defined delayering Start at Delayering position and FOV is read. Stage Position and Ion and electron presets FOV are selected for delayering: Choose Electron and Ion Presets for Delayering Imaging stage position Move Stage to read: Imaging Position Zero...
Proceedings Papers

ISTFA2012, ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis, 281-285, November 11–15, 2012,
... fault simulations in the memory and a semi automatic comparison against the measured TRE curves can be done. This process is based on a max, mean, minimum or shape matching algorithm for a given time frame. The GUI of the program will then suggest matching candidates and the user can select or deselect...
Proceedings Papers

ISTFA2012, ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis, 509-519, November 11–15, 2012,
.... ?? 2010 [15] Synopsis TetraMAX ATPG User Guide Version D- 2010.03-SP5 [16] Mentor Graphics ATPG and Failure Diagnosis Tools Reference Manual Version 8.2009_3 [17] Kevin Gearhardt , Chris Schuermyer, Ruifeng Guo Improving Fault Isolation using Iterative Diagnosis ISTFA 2008: Proceedings from...
Proceedings Papers

ISTFA2004, ISTFA 2004: Conference Proceedings from the 30th International Symposium for Testing and Failure Analysis, 134-138, November 14–18, 2004,
... that can be attributed to the handling, testing, or system assembly processes of an OEM or end user that damaged the motherboard, causing the failure. Manufacturing (MFG) includes all defects caused during the original production of the motherboard defective solder joints on a BGA component, for example...