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soft defect localization

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Proceedings Papers

ISTFA2014, ISTFA 2014: Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis, 307-311, November 9–13, 2014,
..., such as operating voltage and frequency. This paper showcase another successful implementation of DLS technique, combined with design analysis to reveal the root cause for SRAM soft failure. design debugging dynamic laser stimulation failure analysis root cause analysis soft defect localization SRAM...
Proceedings Papers

ISTFA2002, ISTFA 2002: Conference Proceedings from the 28th International Symposium for Testing and Failure Analysis, 21-27, November 3–7, 2002,
...Abstract Abstract We have developed a new scanning laser microscopy methodology, Soft Defect Localization (SDL), that directly locates soft defects from the front side and backside of an IC. The method combines localized laser heating with the pass/fail state of a device to successfully...
Proceedings Papers

ISTFA2006, ISTFA 2006: Conference Proceedings from the 32nd International Symposium for Testing and Failure Analysis, 311-315, November 12–16, 2006,
... process improvements. 90 nm process failure mode analysis root cause analysis soft defect localization SOI microprocessors Applications of Soft Defect Localization (SDL) on AMD Advanced SOI Microprocessors Yi-Xuan Seah, M Palaniappan, JM Chin Advanced Micro Devices (S) Pte Ltd, 508, Chai Chee...
Proceedings Papers

ISTFA2006, ISTFA 2006: Conference Proceedings from the 32nd International Symposium for Testing and Failure Analysis, 426-430, November 12–16, 2006,
... will be described. Finally an interpretation of the results will be proposed. debugging DRAM devices electrical analysis infrared laser microscope root cause analysis soft defect localization Soft defect localization technique for design and debug on DRAM devices Martin Versen, Qimonda AG, PD PT PRE...
Proceedings Papers

ISTFA2007, ISTFA 2007: Conference Proceedings from the 33rd International Symposium for Testing and Failure Analysis, 191-192, November 4–8, 2007,
...Abstract Abstract Equipment manufacturers have developed peripherals for their tools that add soft defect localization (SDL) capability to existing optical beam tools, in many cases providing excellent results. However, these upgrades add significant cost to the tool. This paper presents...
Proceedings Papers

ISTFA2009, ISTFA 2009: Conference Proceedings from the 35th International Symposium for Testing and Failure Analysis, 38-42, November 15–19, 2009,
...Abstract Abstract In this paper, we describe a modified soft defect localization (SDL) technique, PSDL (pseudo-soft defect localization), to localize pseudo-soft defects in integrated circuits (ICs). Similar to soft defects, functional failures due to pseudo-soft defects are sensitive...
Proceedings Papers

ISTFA2011, ISTFA 2011: Conference Proceedings from the 37th International Symposium for Testing and Failure Analysis, 158-163, November 13–17, 2011,
...Abstract Abstract Dynamic Laser Stimulation (DLS) techniques for Soft Defect Localization (SDL) have been well documented for logic devices [1][2]. More recent literature has broadened the traditional SDL pass/fail mapping by employing multiple device parameters including power analysis [3...
Proceedings Papers

ISTFA2005, ISTFA 2005: Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis, 115-120, November 6–10, 2005,
...Abstract Abstract Soft Defect Localization (SDL) is an analysis technique where changes in the pass/fail condition of a test are monitored while a laser is scanned across a die.[1,2,3,4] The technique has proven its usefulness for quickly locating failing nodes for functional fails...
Proceedings Papers

ISTFA2005, ISTFA 2005: Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis, 128-134, November 6–10, 2005,
...Abstract Abstract A new localization method called LIA-SDL is introduced and applied to scan shift problems. The method combines local thermal stimulation technique with lock-in technique applied to periodical test pattern. The localization capability on soft defects is shown in comparison...
Proceedings Papers

ISTFA2014, ISTFA 2014: Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis, 396-399, November 9–13, 2014,
...Abstract Abstract Soft Defect Localization (SDL) is a dynamic laser-based failure analysis technique that can detect circuit upsets (or cause a malfunctioning circuit to recover) by generation of localized heat or photons from a rastered laser beam. SDL is the third and seldom used method...
Proceedings Papers

ISTFA2015, ISTFA 2015: Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis, 31-34, November 1–5, 2015,
...Abstract Abstract It is difficult to localize the soft defect on analog and mixed-signal ICs only by OBIRCH, because OBIRCH laser scanning module could not synchronize with the IC under functional test, and the failure modes on analog and mixed-signal ICs are complicated. In this paper...
Proceedings Papers

ISTFA2020, ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis, 103-107, November 15–19, 2020,
...Abstract Abstract Soft Defect Localization (SDL) method has been a common failure analysis technique used in fault isolation of temperature dependent failures, however proper signal conditioning and conversion of the monitored signal into a pass/fail signal are critical in acquiring an accurate...
Proceedings Papers

ISTFA2012, ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis, 596-600, November 11–15, 2012,
...), and multiple point microprobing. This paper will examine relatively low-cost cold temperature systems that can hold samples at steady state extreme low temperatures and describe a case study where a cold temperature stage was combined with LSM soft defect localization (SDL) to rapidly identify the cause...
Proceedings Papers

ISTFA2013, ISTFA 2013: Conference Proceedings from the 39th International Symposium for Testing and Failure Analysis, 350-356, November 3–7, 2013,
...Abstract Abstract Soft Defect Localization (SDL) is a laser scanning methodology that is commonly used to isolate integrated circuits soft defects. The device is exercised by a functional vector set in a loop manner while localized laser heating stimulates a change in the pass/ fail (P/F...
Proceedings Papers

ISTFA2021, ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, 84-95, October 31–November 4, 2021,
... how analysts were able to induce and diagnose the underlying failure by using external signals, complex triggering, and resistive heating to compensate for limitations in laser power. laser stimulation soft defect localization temperature dependent failures ISTFA 2021: Proceedings from...
Proceedings Papers

ISTFA2009, ISTFA 2009: Conference Proceedings from the 35th International Symposium for Testing and Failure Analysis, 278-282, November 15–19, 2009,
...Abstract Abstract The failure localization on analog & mixed mode ICs in functional mode (AC signals) has become more and more challenging in the last few years. Due to an increasing integration and complexity of these devices, the number of defects, especially those named “soft”, raised...
Proceedings Papers

ISTFA2010, ISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis, 217-223, November 14–18, 2010,
...Abstract Abstract Dynamic Laser Stimulation (DLS) techniques proved to be very efficient in soft defect localization bringing a lot of information about the device internal behavior. We need to use external parameter measurements such as frequency, delay, voltage etc to perform these techniques...
Proceedings Papers

ISTFA2019, ISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis, 179-181, November 10–14, 2019,
...]. Soft-Defect Localization / Dynamic Laser Stimulation (SDL/DLS) can also be applied on soft (Vmin) row/column fails for further isolation [2]. However, some failures do not have abnormal emission spots or DLS sensitivity and require different localization techniques. Laser Voltage Imaging (LVI...
Proceedings Papers

ISTFA2009, ISTFA 2009: Conference Proceedings from the 35th International Symposium for Testing and Failure Analysis, 6-15, November 15–19, 2009,
... of the fault is difficult to isolate. SIFT (Stimulus Induced Fault Test), RIL (Resistive Interconnect Localization) and SDL (Soft Defect Localization) can identify anomalies functionally using induced thermal gradients to the metal but does not address how to analyze embedded temperature sensitive defects...
Proceedings Papers

ISTFA2013, ISTFA 2013: Conference Proceedings from the 39th International Symposium for Testing and Failure Analysis, 430-433, November 3–7, 2013,
... on defectively related issue. However, for soft defect localization such as S/D leakage or short due to design related, it may not be simple to identify it. AFP and its applications have been successfully engaged to overcome such shortcoming, In this paper, two case studies on systematic issues due to soft...