1-20 of 51 Search Results for

shmoo plots

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Proceedings Papers

ISTFA2017, ISTFA 2017: Conference Proceedings from the 43rd International Symposium for Testing and Failure Analysis, 511-519, November 5–9, 2017,
... of a memory array. The resource includes a customized pattern set which can then be used with the unique Advanced Characterization shmoo plot routine to fully characterize any given failure mode. The sub-array patterns and characterization data can provide a clear understanding of the failure and reduce...
Proceedings Papers

ISTFA2019, ISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis, 323-328, November 10–14, 2019,
... doped drain (LDD) is designated. This defect leads to a failure mode that is consistent with hot-carrier injection in complementary metal-oxide semiconductor (CMOS) transistors. This paper presents the testability from a fault isolation aspect, shmoo plot characterization, and backside optical...
Proceedings Papers

ISTFA2009, ISTFA 2009: Conference Proceedings from the 35th International Symposium for Testing and Failure Analysis, 193-197, November 15–19, 2009,
... or soft failures in which the device only fails at certain parameters are prevalent, and these types of failures are hard to detect using simulation tools. Low or high Vcc fails are examples of these parametric failures and are seen as an anomaly in shmoo plots. It is due to these types of failures...
Proceedings Papers

ISTFA2014, ISTFA 2014: Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis, 358-364, November 9–13, 2014,
... plot for a reference good sample. Figure-2 Shmoo plot for a marginal voltage fail sample. A Shmoo plot (Figure-2) of a failing sample shows a problem at low voltage compared to that of a good sample (Figure-1). The output data pattern from ATE is 0111 below a certain voltage level. It is commonly...
Proceedings Papers

ISTFA2007, ISTFA 2007: Conference Proceedings from the 33rd International Symposium for Testing and Failure Analysis, 86-92, November 4–8, 2007,
... the electrical failure is Shmoo plot [13]. It allows the creation of 2D or 3D plots, useful for fixing experimental setup conditions. It consists on variation of at least two of above mentioned electrical or environmental parameters, and then observation of the specified IC outputs. If the result is in 86 ISTFA...
Proceedings Papers

ISTFA2004, ISTFA 2004: Conference Proceedings from the 30th International Symposium for Testing and Failure Analysis, 47-51, November 14–18, 2004,
... One other source of very useful information in determining the type of the defect is the shmoo plot. Shmoo plots are widely used as a characterization tool for the performance of the IC in relation with the changes in the environment such as temperature, timing and power supply voltage...
Proceedings Papers

ISTFA2015, ISTFA 2015: Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis, 241-244, November 1–5, 2015,
.... Figure 9 Shmoo plot for a fail and a reference sample. 242 The shmoo plot of a fail sample shows over 100mV lack of low voltage margin compared to a reference sample as shown in Figure 9. The output data of scan chain is 0011 at pass voltage but the data changed to 0111 at fail voltage...
Proceedings Papers

ISTFA2020, ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis, 345-351, November 15–19, 2020,
.../asm.cp.istfa2020p0345 In addition, tester and failure analysis equipment can be used to diagnose chain hold-time faults. [16] proposed to use Load Pass Unload Fail/Load Fail Unload Pass (LPUF/LFUP) to diagnose failures with passing region in their shmoo plots. [15] presented a method which shifted the faulty chain...
Proceedings Papers

ISTFA2005, ISTFA 2005: Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis, 106-114, November 6–10, 2005,
... and the practical challenges of synchronizing a scanned laser beam with a tester. After a brief review of laser-semiconductor interaction (dynamic signal propagation variation) we will present LADA [6], SDL [7] and RIL [8,9] implementation with two short examples. Shmoo plots, functional tests and laser...
Proceedings Papers

ISTFA2005, ISTFA 2005: Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis, 510-516, November 6–10, 2005,
... shmoo plots. If the shmoo plots show passing region(s), then data collection based on Load Pass Unload Fail/Load Fail Unload Pass (LPUF/LFUP) experiments is used to determine the location of defective scan cell(s). However, if the device shows a solid failure, data collection based on Scan Shift Logic...
Proceedings Papers

ISTFA2016, ISTFA 2016: Conference Proceedings from the 42nd International Symposium for Testing and Failure Analysis, 76-81, November 6–10, 2016,
... Test Equipment (ATE) system. Porting to ATE allowed for two major advantages: The test of the fail would have pico-second control of the timing of the LVD interrupt and PLL clock edges. A tester allowed for the collection of picosecond resolution shmoo plots to show the relationship between the two...
Proceedings Papers

ISTFA2021, ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, 369-376, October 31–November 4, 2021,
... a logic gate or along a path in such a way that the total propagation delay falls outside the specified limit. There are Figure 1: A typical SAF fail shmoo plot with constant error count In Figure 1, a typical SAF pattern shmoo plot for a screened device with static failure is shown. The device exhibits...
Proceedings Papers

ISTFA2017, ISTFA 2017: Conference Proceedings from the 43rd International Symposium for Testing and Failure Analysis, 526-537, November 5–9, 2017,
... for fault isolation of marginal and temperature-sensitive failures. It uses a 1.3um laser to scan the die and induce a localized heating on the die. Shmoo plotting is performed to characterize the device at different conditions like voltage and speed. Shmoo could be performed at room and hot temperatures...
Proceedings Papers

ISTFA2019, ISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis, 419-425, November 10–14, 2019,
... Stuck-At (Compressed) PASS Passing the patterns implemented in production. IDDQ currents are normal. Test coverage issue Transition Delay (Compressed) PASS IDDQ (Uncompressed) PASS 420 The returned unit was then subjected to shmoo plotting using the compressed stuck at and transition delay patterns...
Proceedings Papers

ISTFA2017, ISTFA 2017: Conference Proceedings from the 43rd International Symposium for Testing and Failure Analysis, 214-220, November 5–9, 2017,
... and Failure Analysis November 05 November 09, 2017, Pasadena, California, USA DOI: 10.31399/asm.cp.istfa2017p0214 Copyright © 2017 ASM International® All rights reserved. www.asminternational.org Figure 1. Voltage v/s frequency shmoo plot for MBIST vector on a good and a failing device. DLS using 1340nm laser...
Proceedings Papers

ISTFA2008, ISTFA 2008: Conference Proceedings from the 34th International Symposium for Testing and Failure Analysis, 332-338, November 2–6, 2008,
... is done for several devices. The window width is 4ns and corresponds to 1V because of our acquisition card voltage limitation. So the medium value Tlim, is 500mv. A shmoo plot [7] of voltage versus propagation delay is performed before and after the live test. The live test must not be destructive...
Proceedings Papers

ISTFA2019, ISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis, 168-172, November 10–14, 2019,
... location from low voltage scan chain failure analysis. Figure 9: Scan chain pattern shmoo plot. As shown in Fig. 9, the fail device showed less voltage margin from the scan chain test pattern compared with a reference device. The shmoo boundary looks like having a typical shape of a hold violation which...
Proceedings Papers

ISTFA2015, ISTFA 2015: Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis, 264-266, November 1–5, 2015,
... region. Passing regions started at VDD~0.875V. (c) Shmoo with no laser (SIL landed on the failing region.) Passing region started at VDD~0.88V. Figure 2. Shmoo plots showing sensitivity with laser at the site sensitive to laser (a) and the site insensitive to laser (b). Vmin shifted almost 0.14V. (c...
Proceedings Papers

ISTFA2014, ISTFA 2014: Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis, 436-445, November 9–13, 2014,
... and diagnosis tool sets. ATE failure verification Characterization by Test Engineering on ATE Traditional ATPG Diagnosis by Design Engineering Fault Localization Destructive Physical Analysis Digital functionality test failure Capture failing vectors Shmoo plotting See effect of temperature, speed...
Proceedings Papers

ISTFA2021, ISTFA 2021: Tutorial Presentations from the 47th International Symposium for Testing and Failure Analysis, e1-e99, October 31–November 4, 2021,
... to nominal Vdd Data from Kumar, et al. ; Han, et al. ; Mattey et al.; & Bellaouar, et al. 64 [AMD Official Use Only] Effects of Reverse Temperature on Shmoo Plots Shmoo Test Characterization Results of 28nm CMOS HKMG Speed Path 25C Shmoo Plot Hot Shmoo Plot For Vdd Above Vins; Temperature has Laser...