1-20 of 37 Search Results for

photoelectric laser stimulation

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Proceedings Papers

ISTFA2014, ISTFA 2014: Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis, 330-334, November 9–13, 2014,
... at high laser power. This activation threshold revealed its dependence on laser power and wells biasing. Based on the measurements made during our experiments, an electrical model is proposed that makes it possible to simulate the effects induced by photoelectric laser stimulation. biasing bipolar...
Proceedings Papers

ISTFA2012, ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis, 135-142, November 11–15, 2012,
... stimulation, in order to model and anticipate the behavior of more complex circuits. This paper characterizes and analyses effects induced by a static photoelectric laser on a 90 nm technology PMOS transistor. Comparisons between currents induced in short or long channel transistors for both ON and OFF states...
Proceedings Papers

ISTFA2012, ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis, 143-150, November 11–15, 2012,
...Abstract Abstract This paper presents the electrical model of an NMOS transistor in 90nm technology under 1064nm Photoelectric Laser Stimulation. The model was built and tuned from measurements made on test structures and from the results of physical simulation using Finite Element Modeling...
Proceedings Papers

ISTFA2021, ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, 154-162, October 31–November 4, 2021,
..., but photoelectric laser stimulation (PLS) gets little attention. Considering the potential advantages of PLS over other techniques (e.g., less power is required to generate current-voltage changes and the effect can be triggered at shorter wavelengths, which can lead to improved spatial resolution), the authors set...
Proceedings Papers

ISTFA2005, ISTFA 2005: Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis, 106-114, November 6–10, 2005,
...Abstract Abstract In this paper we report on the application field of Dynamic Laser Stimulation (DLS) techniques to Integrated Circuit (IC) analysis. The effects of thermal and photoelectric laser stimulation on ICs are presented. Implementations, practical considerations and applications...
Proceedings Papers

ISTFA2003, ISTFA 2003: Conference Proceedings from the 29th International Symposium for Testing and Failure Analysis, 371-377, November 2–6, 2003,
... for defect localization from the front and backside of ICs. Thermal Laser Stimulation (TLS) techniques, such as OBIRCH and TIVA, have shown to rapidly localize short-circuits and ESD defects causing abnormal current leakage. As for Photoelectric Laser Stimulation (PLS) techniques, namely LIVA and OBIC...
Proceedings Papers

ISTFA2013, ISTFA 2013: Conference Proceedings from the 39th International Symposium for Testing and Failure Analysis, 361-368, November 3–7, 2013,
...] A. Sarafianos, R. Llido, J. Dutertre, O. Gagliano, V. Serradeil, M. Lis- art, V. Goubier, A. Tria, V. Pouget, and D. Lewis, Building the electrical model of the photoelectric laser stimulation of a PMOS transistor in 90 nm technology, Microelectronics Reliability, vol. 52, no. 9-10, pp. 2035 2038, 2012. [28...
Proceedings Papers

ISTFA2015, ISTFA 2015: Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis, 14-20, November 1–5, 2015,
...). It is based on photoelectric laser stimulation effect. Photocurrent generated induces timing shifts in critical signal paths resulting in a temporary flip of IC test state from pass-fail or vice versa [1, 2, 3]. By custom practice, a 1064 nm continuous wave (cw) laser beam rasters the region of interest (ROI...
Proceedings Papers

ISTFA2008, ISTFA 2008: Conference Proceedings from the 34th International Symposium for Testing and Failure Analysis, 332-338, November 2–6, 2008,
... and limitations and discuss ways to overcome these limitations. Dynamic Laser Stimulation Techniques DLS techniques consist of modifying the operation of a dynamically activated integrated circuit (IC) by photoelectric or photothermal effect using continuous or modulated laser beam stimulation sweeping...
Proceedings Papers

ISTFA2009, ISTFA 2009: Conference Proceedings from the 35th International Symposium for Testing and Failure Analysis, 278-282, November 15–19, 2009,
... stimulation techniques use two major phenomena. A thermal phenomenon, which allows us the localization of resistive issues (resistance variation [7] and Seebeck effect [8 is often implemented by the use of a laser wavelength of 1340nm. A photoelectric phenomenon is induced by a laser wavelength of less than...
Proceedings Papers

ISTFA2016, ISTFA 2016: Conference Proceedings from the 42nd International Symposium for Testing and Failure Analysis, 547-554, November 6–10, 2016,
..., pp. 31-49. [4] A Sarafianos, R Llido, JM Dutertre, O Gagliano, V Serradeil, M Lisart, D Lewis, Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90nm technology , Microelectronics Reliability, 52(9), 2012, pp. 2035-2038. [5] A Sarafianos, R Llido, JM...
Proceedings Papers

ISTFA2010, ISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis, 211-216, November 14–18, 2010,
... period occurs as secondary phenomenon that - if not taken into account properly, may mask the local signal. This effect is strong under CW laser operation and can be drastically reduced in pulsed laser condition. Introduction Static Photoelectric Laser Stimulation (PLS) and Thermal laser stimulation (TLS...
Proceedings Papers

ISTFA2021, ISTFA 2021: Tutorial Presentations from the 47th International Symposium for Testing and Failure Analysis, e1-e99, October 31–November 4, 2021,
... Induced Fault Testing Functional SIFT DLS Dynamic Laser Stimulation DALS Dynamic Analysis by Laser Stimulation TLS or PLS T-LSIM or P-LSIM Thermal or Photoelectric Laser Stimulation TR-LADA Thermal or Photoelectric Laser Signal 2pLADA Injection Microscopy FC-LADA Time Resolved LADA Two-Photon Absorption...
Proceedings Papers

ISTFA2009, ISTFA 2009: Conference Proceedings from the 35th International Symposium for Testing and Failure Analysis, 52-59, November 15–19, 2009,
.... NIR laser stimulation has physical effects on the integrated circuit that are used to locally stimulate the device and localize defec- tive sites. Two infrared wavelengths are commonly used. 1064 nm wave- length laser induces local photoelectric stimulation by creating electron-hole pairs, and so...
Proceedings Papers

ISTFA2009, ISTFA 2009: Conference Proceedings from the 35th International Symposium for Testing and Failure Analysis, 268-271, November 15–19, 2009,
... of the pulsed laser photoelectric stimulation in picosecond single-photon and femtosecond two-photon modes. failure analysis femtosecond laser pulses IC characterization picosecond laser pulses pulsed laser stimulation ultrashort laser pulses Picosecond Single-Photon and Femtosecond Two-Photon...
Proceedings Papers

ISTFA2020, ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis, 6-11, November 15–19, 2020,
.... To facilitate the localization of these fully open defects, we have developed the LICA technique that makes use of photoelectric laser stimulation to modulate the electrical interconnect capacitance [4]. Whereas TLS techniques are typically based on a resistance measurement, our LICA approach follows an AC...
Proceedings Papers

ISTFA2020, ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis, 38-41, November 15–19, 2020,
... dies were found to respond to both thermal (SDL [3]) and photoelectric laser stimulation (LADA [4]) effects. The results obtained with thermal laser stimulation using the 1340nm laser is shown in figure 2a). Emission Microscopy (EMMI) [5] was also used at the product maximum voltage (Vmax) at which...
Proceedings Papers

ISTFA2008, ISTFA 2008: Conference Proceedings from the 34th International Symposium for Testing and Failure Analysis, 188-192, November 2–6, 2008,
... Laser Stimulation (TLS) is achieved using a laser wavelength above 1100nm. At such wavelength practically no photo-generation of carriers takes place. The laser energy is converted into heat within the device absorbing elements, causing a change in their resistivity. Photoelectric Laser Stimulation (PLS...
Proceedings Papers

ISTFA2013, ISTFA 2013: Conference Proceedings from the 39th International Symposium for Testing and Failure Analysis, 329-335, November 3–7, 2013,
...Abstract Abstract Recent developments and improvements of laser probing techniques are a good complement to traditional techniques like emission microscopy (static and dynamic) or laser stimulation (also static and dynamic, based on thermal or photoelectric stimulus) for the investigation...
Proceedings Papers

ISTFA2007, ISTFA 2007: Conference Proceedings from the 33rd International Symposium for Testing and Failure Analysis, 86-92, November 4–8, 2007,
... such as TLS (Thermal Laser Stimulation) [1], [2], [3], [4] and PLS (Photoelectric Laser Stimulation) [5], [6] are commonly implemented in the industrial equipment. Using TLS, the device is heated with a 1300nm infrared laser beam to localize the abnormal resistive issues. Using PLS, a 1064nm wavelength laser...