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oxide-confined vertical-cavity surface-emitting laser

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Proceedings Papers

ISTFA2003, ISTFA 2003: Conference Proceedings from the 29th International Symposium for Testing and Failure Analysis, 426-430, November 2–6, 2003,
...Abstract Abstract A failure analysis case study for oxide confined vertical cavity surface emitting laser (VCSEL) arrays will be presented. The focus of this work is on devices failing with a reduced optical output due to a rapid degradation of the laser diode. The complete analysis flow...
Proceedings Papers

ISTFA2021, ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, 296-300, October 31–November 4, 2021,
...Abstract Abstract Vertical-cavity surface-emitting lasers (VCSELs) have many advantages over edge-emitting devices, but they tend to be more sensitive to increasing current density both in lifetime and reliability. To better understand this relationship, the authors investigated the cause of 35...
Proceedings Papers

ISTFA2020, ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis, 317-321, November 15–19, 2020,
... in detail. fault isolation gallium arsenide optical beam induced resistance change oxide-confined vertical-cavity surface-emitting lasers photoemission electron microscopy root cause analysis transmission electron microscopy Failure Case Studies of GaAs-based Oxide-confined VCSELs Kuang-Tse...
Proceedings Papers

ISTFA2005, ISTFA 2005: Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis, 336-343, November 6–10, 2005,
...Abstract Abstract AOC herein describes a collection of material degradation features observed in Vertical Cavity Surface Emitting Lasers (VCSELs) that have been intentionally degraded with a range of electrostatic discharge (ESD) stress conditions. Failure analysis techniques employed include...
Proceedings Papers

ISTFA2005, ISTFA 2005: Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis, 350-354, November 6–10, 2005,
...Abstract Abstract We present a new failure analysis technique for dark (optically degraded) vertical-cavity surface-emitting lasers. Measurements of spatially and spectrally resolved light emission under reverse bias provide key information on the failure mechanism. electroluminescence...
Proceedings Papers

ISTFA2005, ISTFA 2005: Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis, 344-349, November 6–10, 2005,
.... Samples with material contamination defects, such as the electrical shorts shown below, are typically imaged using the high angle annular detector of the STEM to maximize material contrast. Samples with crystalline defects, such as the dislocation networks often found in Vertical Cavity Surface Emitting...