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oscilloscope pulsing test

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Proceedings Papers

ISTFA2021, ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, 258-262, October 31–November 4, 2021,
...Abstract Abstract In this paper, we describe the difference between oscilloscope pulsing tests and waveform generator fast measurement unit (WGFMU) tests in analyzing high-resistance defects in DRAM main cells. Nanoprobe systems have various constraints in terms of pulsing whether it involves...
Proceedings Papers

ISTFA2011, ISTFA 2011: Conference Proceedings from the 37th International Symposium for Testing and Failure Analysis, 158-163, November 13–17, 2011,
... the use of a high waveform rate oscilloscope, feedback loop, or discrete comparator. Multiple case studies are shown to illustrate the methodology. analog integrated circuit automatic test equipment dynamic laser stimulation high waveform rate oscilloscope logic devices mixed signals soft...
Proceedings Papers

ISTFA2015, ISTFA 2015: Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis, 31-34, November 1–5, 2015,
...-signal ICs. Generally, their failure modes are not digital and various, such as pulse width failure, voltage amplitude (current) failure, delay time failure, and so on. Thus, the variation of the test result under laser heating is not digital, too, and it could not be forced into the OBIRCH amplifier...
Proceedings Papers

ISTFA2010, ISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis, 211-216, November 14–18, 2010,
... on DUT obtained by 50x objective lens (b) The reflected laser micrograph of the scanned area (32x32 pixel) (c) The layout of the scanned area Experimental Setup The device runs in dynamic mode, which is driven by automatic test equipment (ATE). ATE produces the pulse trigger as well. The laser diode...
Proceedings Papers

ISTFA2005, ISTFA 2005: Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis, 245-248, November 6–10, 2005,
...Abstract Abstract Dynamic Electroluminescence Imaging (DEI) is a technique used to observe semiconductor devices as they operate. Much like a traditional oscilloscope, the technique delivers waveform information that is useful for assessing the operation of the circuits that comprise a device...
Proceedings Papers

ISTFA2017, ISTFA 2017: Conference Proceedings from the 43rd International Symposium for Testing and Failure Analysis, 1-7, November 5–9, 2017,
... this kind of events includes a heavy ion accelerator test. However, in this project a different approach, based on a pulsed laser test technique, will be shown. This document presents a methodology which allows to easily study SET effects on electronic devices. 2. Test Methodology Different methods can...
Proceedings Papers

ISTFA2020, ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis, 219-225, November 15–19, 2020,
... PMOS. Their direct current (DC) micro-probing results showed comparable results with the Good unit. However, when they perform pulse micro-probing at the PMOS, they found a switching signal delay at high frequency, no abnormality was observed at low-frequency test. The result they obtained...
Proceedings Papers

ISTFA2019, ISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis, 86-98, November 10–14, 2019,
...Abstract Abstract High core-Vdd overvoltage latchup margins in CMOS ICs are required to enable many reliability screens (e.g., DVS and HTOL testing). We introduce an efficient way to isolate defects that degrade these margins using PEM and 1064/1340 nm CW laser-stimulation. Current pulses from...
Proceedings Papers

ISTFA2016, ISTFA 2016: Conference Proceedings from the 42nd International Symposium for Testing and Failure Analysis, 547-554, November 6–10, 2016,
... for consistent laser exposure throughout the entire test pattern when performing LADA. (a) (b) Figure 4: Output waveforms from photoreceiver as observed on an oscilloscope for pulsed pumping at (a) 10 kHz and (b) Zoom-in on rising edge. The top waveforms represent the 50% duty cycle input signal to TTL. Scope...
Proceedings Papers

ISTFA2015, ISTFA 2015: Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis, 76-81, November 1–5, 2015,
... to generate transient external pulses with an electrostatic field collapse principle. The main benefit here is that the test setup is simple to construct with very low cost tools and that the DUT can be fully operational during the transient events. The only special RF tool required is an oscilloscope...
Proceedings Papers

ISTFA2021, ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, 84-95, October 31–November 4, 2021,
.... Figure 2: Oscilloscope response of the VOUT2 and RST pins on a Good unit. In analog test mode, the VOUT2 regulator was characterized and was found to be good. VOUT2 had a good and stable voltage of 5 V. VOUT2 was most probably failing in normal mode as a consequence of reset events (indicated...
Proceedings Papers

ISTFA2019, ISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis, 197-203, November 10–14, 2019,
... waveforms, however, we implemented a pulse-on-demand blanking method where only one electron- beam pulse per test cycle was allowed through the SEM. Using this method we measured waveforms directly from 14- nm FinFET transistors from backside silicon, as well as from a high-bandwidth copper microstrip...
Proceedings Papers

ISTFA2014, ISTFA 2014: Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis, 391-395, November 9–13, 2014,
... are easily observed. This is due to the fact that the transmission line is a distributed system. A distributed system occurs when a voltage of a pulse along a transmission line is not uniform at all points [2]. ISTFA 2014: Conference Proceedings from the 40th International Symposium for Testing and Failure...
Proceedings Papers

ISTFA1998, ISTFA 1998: Conference Proceedings from the 24th International Symposium for Testing and Failure Analysis, 169-172, November 15–19, 1998,
.... In this manner we can determine the circuit test point signal vc(x,y,t) by controlling the voltage vp(t). We use a laser beam-bounce deflection sen- Z vp(t) vc(x,y,t) Fz Z Z(fr) vs(t) = G (t vp(t) cos(2pifrt) fb pulse delay lock-in amplifier vc(x,y,t) Digital pattern generator pulse generator G t( ) sor...
Proceedings Papers

ISTFA2008, ISTFA 2008: Conference Proceedings from the 34th International Symposium for Testing and Failure Analysis, 180-187, November 2–6, 2008,
.... As a result, we observed a modulated scan-out signal due to the laser stimulation. The oscilloscope images are seen in Fig. 9. Illumination of the white spots injects 1 to the output stream whereas black spots inject 0 for one cycle at which the laser pulse is triggered. Test pattern: {1111 } Test pattern...
Proceedings Papers

ISTFA2016, ISTFA 2016: Conference Proceedings from the 42nd International Symposium for Testing and Failure Analysis, 432-440, November 6–10, 2016,
... Worth, Texas, USA DOI: 10.31399/asm.cp.istfa2016p0432 by the acoustic oscilloscope (A-Scan) as well as knowing the material composition of the device being tested. Figure 2. Image diagram of the A-scan mode. The A-scan is a real- time waveform patterns that displays the acoustic signals based...
Proceedings Papers

ISTFA2004, ISTFA 2004: Conference Proceedings from the 30th International Symposium for Testing and Failure Analysis, 600-603, November 14–18, 2004,
.... www.asminternational.org ISTFA 2004: Conference Proceedings from the 30th International Symposium for Testing and Failure Analysis November 14 November 18, 2004, Worcester, Massachusetts, USA DOI: 10.31399/asm.cp.istfa2004p0600 npn BJT HP 33250 Pulse gen xIVA + power supply SRS 830 Lock-in Amplifier DC bias + small AC...
Proceedings Papers

ISTFA2016, ISTFA 2016: Conference Proceedings from the 42nd International Symposium for Testing and Failure Analysis, 76-81, November 6–10, 2016,
... the reset pin state at the very end of the POR test sequence. Figure 2: Oscilloscope screen capture showing the test sequence to cause the failure on an ADS board. All supplies are initially at nominal voltage and the device is idle after completing the reset sequence. The VDDA supply for ADC modules...
Proceedings Papers

ISTFA2019, ISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis, 68-78, November 10–14, 2019,
.... This approach minimizes the number of missed detection pulses compared to a trigger on the test loop signal. The oscilloscope then measured the duration between the rising edge of the test loop signal and the rising edge of the photon detection pulse and stored this value. Upon completion of a scan, it only...
Proceedings Papers

ISTFA2008, ISTFA 2008: Conference Proceedings from the 34th International Symposium for Testing and Failure Analysis, 227-232, November 2–6, 2008,
... as a test system for the DRAM in the fourth part. The IMS tester acts here simply as a very convenient waveform generator. Each channel is also connected to a TEKTRONIX TDS 784A oscilloscope for the timing measurements. The waveforms and the timing definitions for the incoming data and the qualifier...