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low-noise amplifier

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Proceedings Papers

ISTFA2017, ISTFA 2017: Conference Proceedings from the 43rd International Symposium for Testing and Failure Analysis, 411-415, November 5–9, 2017,
... enables cost reduction and efficient system integration compared to former GaAs and current SiGe solutions. Design for failure analysis (DFFA) is implemented in the low-noise amplifier (LNA) of the radar to identify and compensate process deviations. It consists of scalable capacitor structures...
Proceedings Papers

ISTFA2018, ISTFA 2018: Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis, 303-308, October 28–November 1, 2018,
... the differences between the earlier and novel generation OBIRCH amplifiers. Ring oscillator high standby leakage samples are analyzed using the novel generation amplifier. High signal to noise ratio at applied low bias and current levels on device under test are shown on various samples. Further, a metric...
Proceedings Papers

ISTFA2001, ISTFA 2001: Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis, 151-159, November 11–15, 2001,
... and a laser-scanning microscope. The amplifier used for amplifying the weak voltage or current variations caused by thermal laser stimulation was shown to be a key factor. The design of such a low noise, high gain and fast voltage amplifier is described. From a 3D finite element ANSYS model of the thermal...
Proceedings Papers

ISTFA1998, ISTFA 1998: Conference Proceedings from the 24th International Symposium for Testing and Failure Analysis, 467-471, November 15–19, 1998,
... was then redirected to the PMT at the auxiliary port. Reference figures 1 and 2. Intensified L! CCD Camera d Camera Mirror Mirror Objective Lense 9 ~1 Sample Figure 1. Existing System PMT P Low Noise Intensified Amplifier Camera qSpectrumAnatyzerHp3563A Objective Mirrors enA.rnpk OPA 128 was selected for its low...
Proceedings Papers

ISTFA2021, ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, 146-149, October 31–November 4, 2021,
... were measured at each stress interval. In order to determine which devices and where any defects occurred after the accelerated life tests, an additional test was completed, a Low-Noise Amplifier (LNA) Circuit assessment. The Low-Noise Amplifier (LNA) Circuit assessment determines which HEMT device...
Proceedings Papers

ISTFA2000, ISTFA 2000: Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis, 17-21, November 12–16, 2000,
... by a low noise amplifier. A lock-in amplifier is used as the signal acquisition tool to increase the sensitivity and signal to noise ratio of the collected SCOBIC transient. The output of the lock- in amplifier is fed to the imaging acquisition system to generate the complete SCOBIC image for the region...
Proceedings Papers

ISTFA2006, ISTFA 2006: Conference Proceedings from the 32nd International Symposium for Testing and Failure Analysis, 234-238, November 12–16, 2006,
... of a pulsed laser with a lock-in amplifier to enhance detection sensitivity was first introduced in 2001 [6]. Detection sensitivity is enhanced by pulsing the laser at a specific frequency where the noise level is low together with a lock-in amplifier for signal processing. It has been shown...
Proceedings Papers

ISTFA2007, ISTFA 2007: Conference Proceedings from the 33rd International Symposium for Testing and Failure Analysis, 56-60, November 4–8, 2007,
...: Block diagram of demodulator system. O is a low phase-noise oscillator, S is a 3dB power splitter, D is a delay line, A is an RF amplifier and M is a mixer / phase detector. Considering the components of the system in detail, the heart of the capacitance system is the microstrip line resonator (Fig. 2...
Proceedings Papers

ISTFA2014, ISTFA 2014: Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis, 446-449, November 9–13, 2014,
... an electrical overstress exposure to the devices. Background The Digital Variable Gain Amplifier (DVGA) module is digitally controlled variable-gain amplifier. The module features the integration of a low noise amplifier gain block, a digital-step attenuator (DSA), along with a high linearity ¼ W amplifier (Fig...
Proceedings Papers

ISTFA2007, ISTFA 2007: Conference Proceedings from the 33rd International Symposium for Testing and Failure Analysis, 306-311, November 4–8, 2007,
... measurements such as Received Signal Strength Indicator (RSSI). Any abnormality observed by FA Engineer will lead to investigation along the RX chain such as Low Noise Amplifier (LNA) and Radio Chip. EEPROM Read/Write allows FA Engineer to access to EEPRM of DUT for analysis. For EEPROM Read, FA Engineer can...
Proceedings Papers

ISTFA2003, ISTFA 2003: Conference Proceedings from the 29th International Symposium for Testing and Failure Analysis, 440-445, November 2–6, 2003,
... Fig. 4). Fig. 2. Photography of square integrated inductor. Fig. 3. Photography of octagonal integrated inductor. Fig. 4. Multi-layer inductor. The principal modules of a RF circuit including integrated inductors are the Low Noise Amplifier (LNA), the Voltage Controlled Oscillator (VCO...
Proceedings Papers

ISTFA2017, ISTFA 2017: Conference Proceedings from the 43rd International Symposium for Testing and Failure Analysis, 473-475, November 5–9, 2017,
... (not in the field of view in Figure 1) on n-well tap is negatively biased to forward bias NWell/P+ diode to force 1uA current flow from the gate contact through the short. This current is monitored at the other probe tip (shown in Figure 1) on the gate contact. Then measured current through low noise amplifier...
Proceedings Papers

ISTFA2011, ISTFA 2011: Conference Proceedings from the 37th International Symposium for Testing and Failure Analysis, 35-39, November 13–17, 2011,
...: This area of the substrate has 2 cut locations at package M1. Each of these cut locations are insulated with UV cure material to prevent solder reflowing into the space. Case study Low noise amplifiers are prone to oscillate if a feedback path between its input and output exists. These feedback paths can...
Proceedings Papers

ISTFA2015, ISTFA 2015: Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis, 496-502, November 1–5, 2015,
... 20mm x 1mm. On this system, the signal from the manipulators is fed through vacuum compatible triax cables and out of the chamber to a signal switching unit. A fast, low-noise amplifier is used to convert the current signal to a voltage. The voltage signal is connected to the microscope s video input...
Proceedings Papers

ISTFA2004, ISTFA 2004: Conference Proceedings from the 30th International Symposium for Testing and Failure Analysis, 29-32, November 14–18, 2004,
... constraints must be taken into account: the low current range, often less than one mA, and the submicron lateral resolution which is mostly driven by detector size and working distance. Signal to Noise Ratio (SNR) and detector sensitivity are also key parameters. They play a role in spatial resolution. Among...
Proceedings Papers

ISTFA2000, ISTFA 2000: Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis, 263-266, November 12–16, 2000,
... can really carry out that step. Similar tests carried out on a nitride plus BCB coated GaAs LNA (Low Noise Amplifier) did not show this failure. This was important data because increasing numbers of circuits fabricated at M/A-COM are being encapsulated in this manner. The problem in the multi-layer...
Proceedings Papers

ISTFA2020, ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis, 330-334, November 15–19, 2020,
.... The ground input is connected to the ground terminal of the device under test. The differential amplifier takes the signal generated from high and low inputs, and compares it to ground noise measurements collected from ground input. Figure 2. Modeling data showing benefits of using differential amplifier...
Proceedings Papers

ISTFA2004, ISTFA 2004: Conference Proceedings from the 30th International Symposium for Testing and Failure Analysis, 600-603, November 14–18, 2004,
... a Stanford Research 560 for this purpose. Both the system response with and without the amplifier were characterized. For configurations that included the amplifier, the filter settings were a single pole high pass with a 100 Hz -3dB frequency and a single pole low pass with a 100 kHz -3dB frequency...
Proceedings Papers

ISTFA2011, ISTFA 2011: Conference Proceedings from the 37th International Symposium for Testing and Failure Analysis, 275-286, November 13–17, 2011,
... are absorbed. Note that since all silicon is removed, the use of a -5V bias is safe to the sample. Offset Current Capabilities Attempting to measure a low resistance open (< 1M ) using a two-nanoprobe setup has a noise issue to consider. Small voltage differences between the nanoprobes are typical due...
Proceedings Papers

ISTFA2019, ISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis, 302-307, November 10–14, 2019,
..., the noise is averaged and ultimately reduced. A total change of paradigm was obtained by the exploitation of amplifiers already embedded in SEM detectors [14]. These amplifiers originally designed to perform a different kind of analysis such as backscattered detection or STEM, enable to achieve a low-cost...