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linear waveform generator

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Proceedings Papers

ISTFA2021, ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, 258-262, October 31–November 4, 2021,
... an oscilloscope or pulse generator. There are certain types of devices, such as DRAM cells, for which these systems are ineffective because saturation currents are too small. In this paper, we address this constraint and propose a new way to conduct pulsing tests using the WGFMU's arbitrary linear waveform...
Proceedings Papers

ISTFA2005, ISTFA 2005: Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis, 245-248, November 6–10, 2005,
.... The detected electroluminescence from the HBT was much easier to interpret, as it showed the same waveform characteristics as the driving signal. The HBT response is linear in this case. This is advantageous, as it means that the electroluminescence from such devices embedded in circuitry can reveal...
Proceedings Papers

ISTFA2020, ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis, 108-115, November 15–19, 2020,
... of good LP waveforms include flat logic states and sharp transitions between the states. However higher energy photons increase the probability of generating mobile carriers within the device which adversely affect the characteristics of the waveforms. The waveforms appear distorted [4], [5...
Proceedings Papers

ISTFA2009, ISTFA 2009: Conference Proceedings from the 35th International Symposium for Testing and Failure Analysis, 182-188, November 15–19, 2009,
... than 250mm2 in every stress level of both discharge systems. All samples shown on these plots are measured on the Orion CDM tester. Fig. 7 shows the linear relation of the stress conditions between ESDA and JEDEC 0 2 4 6 8 10 12 14 16 Waveform Ip 1 (A ) ESDA JEDEC 0 100 200 300 400 Waveform tr (p s...
Proceedings Papers

ISTFA2018, ISTFA 2018: Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis, 183-190, October 28–November 1, 2018,
...: linear range; II: saturation; III: functional degradation Similar noise waveforms were obtained for various probe positions and laser powers, with and without supplying the DUT power. This noise is probably induced by the coupling between the external LVx trigger and the detector instrumentation. Once...
Proceedings Papers

ISTFA2006, ISTFA 2006: Conference Proceedings from the 32nd International Symposium for Testing and Failure Analysis, 438-443, November 12–16, 2006,
... of waveforms differed by about a factor of two, but the peak heights followed the same trend vs. Vdd. Figure 7 shows the average amplitude of the photon emission vs. Vdd normalized to its value at 1.80 V. As the figure shows, the emission under a 200 mV range is nominally linear. This justifies our...
Proceedings Papers

ISTFA1999, ISTFA 1999: Conference Proceedings from the 25th International Symposium for Testing and Failure Analysis, 3-9, November 14–18, 1999,
..., there has been a revolution in THz technology, as a number of newly discovered or re-discovered generation and detection schemes have revitalized the field. These techniques, based on frequency conversion using non-linear optics, are often simpler, more reliable, and potentially much less expensive than...
Proceedings Papers

ISTFA1999, ISTFA 1999: Conference Proceedings from the 25th International Symposium for Testing and Failure Analysis, 27-33, November 14–18, 1999,
... to be collected, and (C) the probing pulse. The pulse is walked through the time sweep of interest to sample the averaged waveform stroboscopically. The waveform is sampled many times at each time step and then averaged. The laser pulse is then phase-shifted by precise delay generators in the timing circuit...
Proceedings Papers

ISTFA2013, ISTFA 2013: Conference Proceedings from the 39th International Symposium for Testing and Failure Analysis, 341-349, November 3–7, 2013,
... recognition and comparison, TRE waveform subtraction or manipulation. For the case of time- integrated images, subtraction, comparison, and other linear operations on the images, may be very useful to identify changes caused by pattern changes. Example 1: static inverter chains 148 nm apart Several 4-stage...
Proceedings Papers

ISTFA2017, ISTFA 2017: Conference Proceedings from the 43rd International Symposium for Testing and Failure Analysis, 1-7, November 5–9, 2017,
... Area 3 6 The study of some regions of the device ensured the analysis of the sensitivity of the device. It is possible to observe three areas involved in SET generation. Figure 9 shows one of the waveform signals extracted from area 1 displayed in Figure 8. Figure 9: Output of the device during high...
Proceedings Papers

ISTFA2004, ISTFA 2004: Conference Proceedings from the 30th International Symposium for Testing and Failure Analysis, 9-17, November 14–18, 2004,
...Abstract Abstract A novel laser based technique for waveform probing of integrated circuits is presented. This new technique exploits polarization-dependent opto-electronic effects in silicon integrated circuits to give phase sensitivity via a simple common-path interferometer design...
Proceedings Papers

ISTFA2006, ISTFA 2006: Conference Proceedings from the 32nd International Symposium for Testing and Failure Analysis, 6-12, November 12–16, 2006,
... volume wafer and package level testing. The dependence of phonon generation on material properties yields information not obtained in existing electrical, optical and electron beam testing techniques such as contact tribology, energy dissipation, non-linear device behavior and device resonance modes...
Proceedings Papers

ISTFA2016, ISTFA 2016: Conference Proceedings from the 42nd International Symposium for Testing and Failure Analysis, 514-519, November 6–10, 2016,
... amplitude of the second harmonic helps identify minute deviations in the duty cycle with a scan over a region, as opposed to collecting multiple high resolution waveforms at each node. This can be used to identify timing degradation such as signal slope variation as well. In the second example, identifying...
Proceedings Papers

ISTFA2014, ISTFA 2014: Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis, 210-214, November 9–13, 2014,
... into a voltage-distance signal for fault isolation. This broadband technique has an extremely low time base jitter and high temporal resolution [1]. Here, we use a commercially available electromagnetic (EM) simulation package to run a full 3D analysis to generate the reference EOTPR waveform (Figure 1a...
Proceedings Papers

ISTFA2016, ISTFA 2016: Conference Proceedings from the 42nd International Symposium for Testing and Failure Analysis, 561-563, November 6–10, 2016,
... waveforms starting from Latch to DOUT are collected at HVCC for timing analysis. Fig. 7 shows waveform from LATCH to DOUT. Initial findings did not point to any timing violations starting from LATCH to D-Latch that could be contributing to change in data on DOUT at HVCC. Since LATCH_Q is generated from...
Proceedings Papers

ISTFA2016, ISTFA 2016: Conference Proceedings from the 42nd International Symposium for Testing and Failure Analysis, 27-31, November 6–10, 2016,
... when low laser power levels were used. Thus we conclude that the fundamental BW of VLP (~1-2 GHz) is caused by the intrinsic filling of the device channel with electron-hole pairs generated in a small region by the energetic 577 nm beam. (A) (B) (C) Fig. 8: VLP waveforms (arbitrary units vs. time...
Proceedings Papers

ISTFA2001, ISTFA 2001: Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis, 33-42, November 11–15, 2001,
... are sensitive to probe placement and focus, absolute voltage accuracy is difficult to achieve with LVP. However, for a given focus and probe position, LVP waveforms have been found to be linear with respect to the applied voltage [9]. Voltage linearity under these conditions is expected to hold unless...
Proceedings Papers

ISTFA2017, ISTFA 2017: Conference Proceedings from the 43rd International Symposium for Testing and Failure Analysis, 201-206, November 5–9, 2017,
... stems from increasing photocurrent generation, the analogous shape observed with 785nm likely has the same origin. Figure 6. Four LVP waveforms collected at 12.5MHz and 2mW. In order from the top: (A) 1320nm, (B) 1154nm, (C) 1064nm, and (D) 785nm. Two other observations support this theory. First...
Proceedings Papers

ISTFA1998, ISTFA 1998: Conference Proceedings from the 24th International Symposium for Testing and Failure Analysis, 483-488, November 15–19, 1998,
... for Testing and Failure Analysis November 15 November 19, 1998, Dallas, Texas, USA DOI: 10.31399/asm.cp.istfa1998p0483 Copyright © 1998 ASM International® All rights reserved www.asminternational.org linear region of transistor operation, the source-drain voltage VDS generates an electric field which...
Proceedings Papers

ISTFA2002, ISTFA 2002: Conference Proceedings from the 28th International Symposium for Testing and Failure Analysis, 753-762, November 3–7, 2002,
... generate a relatively large photo-current pulse that can affect device operation. Despite this electrical perturbation, accurate LVP waveforms can be acquired by using equivalent time sampling. In equivalent time sampling, the DUT test pattern must be made to repeat continuously. At the end of each loop...