Search Results for istfa

This presentation is chronologically-progressive to the author's ISTFA Keynote given in 2010: "Counterfeiters' Techniques: Constantly Improving to Avoid Detection - National Security Depends on Us to Keep Up". It shares, in detail, the forensic test methodologies utilized by SMT and ultimately the research breakthroughs which gave the labs crystal-clear insight into the counterfeiters specific step-by-step rework process. The presentation includes all forensic work utilized in exposing the "Micro-blast" & "Flat-Lap" counterfeit processes identified at SMT labs during 2011, as well as unpublished novel process threats and refinements identified in 2013 & 2014. It also covers the counterfeit mitigation work that SMT supported with the GAO and Senate Armed Services Committee's investigation into counterfeits within DoD supply chains during the 2011-2012 time period.

The International Symposium for Testing and Failure Analysis (ISTFA) 2010 event added a focus topic on Counterfeiting in Electronics. This topic was chosen because of the emergence of this concern and the critical role that Failure Analysis plays in this challenge. Failure Analysts will be involved deeply as companies worldwide are attempting to reduce the impact of increasing numbers of counterfeit products in the supply line and in fielded products. This paper will attempt to provide an overview of the topic and support the contributors to ISTFA 2010 while providing additional resources for information.

Listings of the EDFAS 2023 Board of Directors and the ISTFA 2023 Organizing Committee and Session Chairs.

Presentation slides for the ISTFA 2023 Tutorial session “ESD Challenges in Advanced CMOS Technologies-Designing Diode Based ESD Protection.”

Presentation slides for the ISTFA 2023 Tutorial session “Fan Out for Advanced Packaging Applications.”

Presentation slides for the ISTFA 2023 Tutorial session “Fundamentals of Nanoprobe Analysis.”

Presentation slides for the ISTFA 2023 Tutorial session “An Introduction to the FIB as a Microchip Circuit Edit Tool (2023 Update).”

Presentation slides for the ISTFA 2023 Tutorial session “MOSFET Testing and Interpretation Overview.”

Presentation slides for the ISTFA 2023 Tutorial session “Flip-Chip and Backside Techniques (2023 Update).”

Presentation slides for the ISTFA 2023 Tutorial session “SEM Based EBIC, EBAC, and E-Beam Probing Techniques.”

Presentation slides for the ISTFA 2023 Tutorial session “Laser Probing-Theory, Applications, and State-of-Art.”

Listings of the EDFAS 2023 Board of Directors and the ISTFA 2023 Organizing Committee and Session Chairs.

Presentation slides for the ISTFA 2023 Tutorial session “A Practical Tutorial on ATE-Based Electrical Fault Isolation of Digital SoCs Using Photon Emission and Laser Voltage Imaging/Probing.”

Presentation slides for the ISTFA 2023 Tutorial session “LADA and SDL-Powerful Techniques for Marginal Failures (2023 Update).”

Presentation slides for the ISTFA 2023 Tutorial session “Review of Scanning Probe Microscopy Methods for Failure Analysis (2023 Update).”

Presentation slides for the ISTFA 2023 Tutorial session “Sample Preparation for Electron Microscopy Characterization (SEM and TEM) and Failure Analysis of Advanced Semiconductor Devices.”

Presentation slides for the ISTFA 2023 Tutorial session “TEM Techniques for Semiconductor Failure Analysis.”

Presentation slides for the ISTFA 2023 Tutorial session “In-situ Correlative AFM-SEM Characterization for Failure Analysis.”

Presentation slides for the ISTFA 2023 Tutorial session “Advanced FIB/SEM Sample Preparation and Analysis Techniques.”

Presentation slides for the ISTFA 2023 Tutorial session “Voltage Contrast within Electron Microscopy- From a Curious Effect to Debugging Modern ICs.”