This presentation is chronologically-progressive to the author's ISTFA Keynote given in 2010: "Counterfeiters' Techniques: Constantly Improving to Avoid Detection - National Security Depends on Us to Keep Up". It shares, in detail, the forensic test methodologies utilized by SMT and ultimately the research breakthroughs which gave the labs crystal-clear insight into the counterfeiters specific step-by-step rework process. The presentation includes all forensic work utilized in exposing the "Micro-blast" & "Flat-Lap" counterfeit processes identified at SMT labs during 2011, as well as unpublished novel process threats and refinements identified in 2013 & 2014. It also covers the counterfeit mitigation work that SMT supported with the GAO and Senate Armed Services Committee's investigation into counterfeits within DoD supply chains during the 2011-2012 time period.

The International Symposium for Testing and Failure Analysis (ISTFA) 2010 event added a focus topic on Counterfeiting in Electronics. This topic was chosen because of the emergence of this concern and the critical role that Failure Analysis plays in this challenge. Failure Analysts will be involved deeply as companies worldwide are attempting to reduce the impact of increasing numbers of counterfeit products in the supply line and in fielded products. This paper will attempt to provide an overview of the topic and support the contributors to ISTFA 2010 while providing additional resources for information.

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