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Proceedings Papers

ISTFA2019, ISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis, 204-208, November 10–14, 2019,
.... GLOBALFOUNDRIES began a project to create a more robust repeatable resistive structure by removing several variables. Rather than direct writing lines onto a top surface layer, a confined deposition based on the concepts of dual damascene processing used with copper layers in modern semiconductor fabrication...
Proceedings Papers

ISTFA2018, ISTFA 2018: Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis, 295-299, October 28–November 1, 2018,
... Abstract A BEOL compatible Metal-Insulator-Metal capacitor (MIMCAP) was successfully developed for GlobalFoundries 14nm technology node, and subsequently introduced on customer designs as decoupling capacitors. The lead production silicon wafers with MIMCAP showed good functionality at wafer...
Proceedings Papers

ISTFA2019, ISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis, i-iii, November 10–14, 2019,
... Dr. Felix Beaudoin Member at Large GLOBALFOUNDRIES Ms. Rebecca L. Holdford Member at Large Texas Instruments Mr. Ted Lundquist Member at Large Zeiss Smt Pcs Ms. Renee Parente Member at Large Advanced Micro Devices (amd) Dr. Tom Schamp Member at Large MAS Ms. Mary Anne Jerson Administrator, Affiliate...
Proceedings Papers

ISTFA2017, ISTFA 2017: Conference Proceedings from the 43rd International Symposium for Testing and Failure Analysis, iv-vi, November 5–9, 2017,
... at Large Consultant Mr. Ryan Ross Member at Large NASA Jet Propulsion Laboratory Dr. Sam Subramanian Member at Large NXP Semiconductors Board Committees Position Affiliation Dr. Felix Beaudoin EDFA Chair GlobalFoundries Dr. Mayue Xie Education Chair Intel Corp. Dr. Thomas Moore Membership Chair Waviks, Inc...
Proceedings Papers

ISTFA2016, ISTFA 2016: Conference Proceedings from the 42nd International Symposium for Testing and Failure Analysis, iii-v, November 6–10, 2016,
... Member at Large Consultant Mr. Ryan Ross Member at Large NASA Jet Propulsion Laboratory Dr. Sam Subramanian Member at Large NXP Semiconductors Board Committees Position Affiliation Dr. Felix Beaudoin EDFA Chair GlobalFoundries Dr. Mayue Xie Education Chair Intel Corp. Dr. Thomas Moore Membership Chair...
Proceedings Papers

ISTFA2015, ISTFA 2015: Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis, iii-v, November 1–5, 2015,
... Corporation Case Studies and the FA Process Zhigang Song, GlobalFoundries Rose Ring, GlobalFoundries Malta Detecting Counterfeit Microelectronics Robert Champaign, Raytheon Network Centric Systems Joe Colangelo, Raytheon Network Centric Systems Device Failure Analysis Victoria Bruce, Qualcomm Incorporated Ted...
Proceedings Papers

ISTFA2018, ISTFA 2018: Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis, iv-v, October 28–November 1, 2018,
... 1, 2018, Phoenix, Arizona, USA DOI: 10.31399/asm.cp.istfa2018fm01 Copyright © 2018 ASM International® All rights reserved www.asminternational.org 2018 ORGANIZING COMMITTEE Ms. Efrat Moyal General Chair LatticeGear Dr. Felix Beaudoin Vice General Chair GLOBALFOUNDRIES Dr. David Grosjean Technical...
Proceedings Papers

ISTFA2022, ISTFA 2022: Tutorial Presentations from the 48th International Symposium for Testing and Failure Analysis, iii-vi, October 30–November 3, 2022,
... GLOBALFOUNDRIES EDFAS Board Members Dr. James J. Demarest Dr. Felix Beaudoin Ms. Renee Parente Dr. Lee Knauss, FASM Position President Vice President/Finance Officer Secretary Immediate Past President Affiliation International Business Machine GLOBALFOUNDRIES Advanced Micro Devices (AMD) Booz Allen Hamilton Mr...
Proceedings Papers

ISTFA2022, ISTFA 2022: Conference Proceedings from the 48th International Symposium for Testing and Failure Analysis, iii-vi, October 30–November 3, 2022,
... GLOBALFOUNDRIES EDFAS Board Members Dr. James J. Demarest Dr. Felix Beaudoin Ms. Renee Parente Dr. Lee Knauss, FASM Position President Vice President/Finance Officer Secretary Immediate Past President Affiliation International Business Machine GLOBALFOUNDRIES Advanced Micro Devices (AMD) Booz Allen Hamilton Mr...
Proceedings Papers

ISTFA2021, ISTFA 2021: Tutorial Presentations from the 47th International Symposium for Testing and Failure Analysis, iii-v, October 31–November 4, 2021,
... Beaudoin GLOBALFOUNDRIES EDFAS Board Members Dr. James J. Demarest Dr. Felix Beaudoin Ms. Renee Parente Dr. Lee Knauss, FASM Position President Vice President/Finance Officer Secretary Immediate Past President Affiliation International Business Machine GLOBALFOUNDRIES Advanced Micro Devices (amd) Booz...
Proceedings Papers

ISTFA2021, ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, iii-v, October 31–November 4, 2021,
..., Arizona, USA DOI: 10.31399/asm.cp.istfa2021fm01 Copyright © 2021 ASM International® All rights reserved. www.asminternational.org EDFAS 2021-2022 BOARD OF DIRECTORS EDFAS President Dr. James J. Demarest International Business Machine EDFAS Vice President Dr. Felix Beaudoin GLOBALFOUNDRIES EDFAS Board...
Proceedings Papers

ISTFA2020, ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis, i-ii, November 15–19, 2020,
... GLOBALFOUNDRIES EDFAS Board Members Position Affiliation Dr. James J. Demarest President International Business Machine Dr. Felix Beaudoin Vice President/Finance Officer GLOBALFOUNDRIES Ms. Renee Parente Secretary Advanced Micro Devices (amd) Dr. Lee Knauss, FASM Immediate Past President Booz Allen Hamilton Mr...
Proceedings Papers

ISTFA2023, ISTFA 2023: Conference Proceedings from the 49th International Symposium for Testing and Failure Analysis, iii-vi, November 12–16, 2023,
... Abstract Listings of the EDFAS 2023 Board of Directors and the ISTFA 2023 Organizing Committee and Session Chairs. ISTFA Conference httpsdoi.org/10.31339/asm.cp.istfa2023fm01 EDFAS 2023 BOARD OF DIRECTORS EDFAS President Dr. Felix Beaudoin GLOBALFOUNDRIES EDFAS Board Members Dr. Felix...
Proceedings Papers

ISTFA2023, ISTFA 2023: Tutorial Presentations from the 49th International Symposium for Testing and Failure Analysis, iii-vi, November 12–16, 2023,
... Abstract Listings of the EDFAS 2023 Board of Directors and the ISTFA 2023 Organizing Committee and Session Chairs. ISTFA Conference httpsdoi.org/10.31339/asm.cp.istfa2023tpfm01 EDFAS 2023 BOARD OF DIRECTORS EDFAS President Dr. Felix Beaudoin GLOBALFOUNDRIES EDFAS Board Members Dr...
Proceedings Papers

ISTFA2018, ISTFA 2018: Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis, 153-155, October 28–November 1, 2018,
..., Kok Hin (Rick) Teo, Wayne Zhao, Joshua Moore, Laurent Dumas GLOBALFOUNDRIES, Malta, NY, USA Abstract Through inline processing of a prospective Spin on Hardmask (SOH) material, bubble defects were observed randomly across a wafer. Several complementary FA techniques were utilized to characterize...
Proceedings Papers

ISTFA2013, ISTFA 2013: Conference Proceedings from the 39th International Symposium for Testing and Failure Analysis, 203-207, November 3–7, 2013,
... fault isolation IC devices semiconductor manufacturing Advantage of AFP nanoprobing on the 28nm technology failure analysis C.Q. Chen, G.B. Ang, S.P. Zhao, Q. Alfred. N. Dayanand, K. Dnyan, B.H. Liu Failure Analysis group, Quality and Customer Enablement (QCE) department, GLOBALFOUNDRIES Singapore...
Proceedings Papers

ISTFA2016, ISTFA 2016: Conference Proceedings from the 42nd International Symposium for Testing and Failure Analysis, 564-567, November 6–10, 2016,
... imaging laser voltage probing SRAM Fault Isolation of DQ Failures in 14nm SRAM using Laser Voltage Imaging and Probing K. A. Serrels, A. Kalarikkal, A. M. Jakati, and G. Dabney GLOBALFOUNDRIES, FAB8 Center for Complex Analysis, Electrical Fault Isolation Group, Characterization Division, 400 Stone...
Proceedings Papers

ISTFA2016, ISTFA 2016: Conference Proceedings from the 42nd International Symposium for Testing and Failure Analysis, 568-570, November 6–10, 2016,
... for pursuing precise analysis of process evaluation and development in a 300mm fab at the East Fishkill (EFK) site of GLOBALFOUNDRIES. Full wafer usage for CLM process maintains integrity of wafers, since the CLM tool is a 300mm dual beam (FIB and SEM) suitable for a manufacturing environment. Therefore...
Proceedings Papers

ISTFA2012, ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis, 574-577, November 11–15, 2012,
..., Zhao Si Ping QRA Department, GLOBALFOUNDRIES Singapore, 60 Woodlands Industrial Park D, Street 2, Singapore 738406 Yao Yuan, Fab 7, Process Integration, GLOBALFOUNDRIES Singapore, 60 Woodlands Industrial Park D, Street 2, Singapore 738406 Teo Kim Hong, Chen Ye, Tee Irene, Lee Gek Li, Chen Changqing...
Proceedings Papers

ISTFA2020, ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis, 38-41, November 15–19, 2020,
..., Thirukumaran Mahalingam1, Nuh Yuksek1, Lu Yuan1, Wang Tao1, Lillian Li1, Sushruth Goud Perumalla1, Shweta Arora2, Trejo Rust1 GLOBALFOUNDRIES, Malta, New York, USA GLOBALFOUNDRIES, Bengaluru, India Introduction A new low level systematic voltage sensitive scan chain fail pattern in the wafer donut region...