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counterfeit

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Proceedings Papers

ISTFA2010, ISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis, 364-368, November 14–18, 2010,
...Abstract Abstract The electronics supply chain is being increasingly infiltrated by non-authentic, counterfeit electronic parts, whose use poses a great risk to the integrity and quality of critical hardware. There is a wide range of counterfeit parts such as leads and body molds. The failure...
Proceedings Papers

ISTFA2010, ISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis, 369-372, November 14–18, 2010,
...Abstract Abstract Counterfeit parts are marketed with the intent to deceive the customer. This intent to deceive defines a counterfeit part and separates it from faulty parts, which have defects that are unknown to the manufacturer or distributor. This paper presents three cases in which...
Proceedings Papers

ISTFA2011, ISTFA 2011: Conference Proceedings from the 37th International Symposium for Testing and Failure Analysis, 234-237, November 13–17, 2011,
...Abstract Abstract The counterfeiting of semiconductor devices has become an important contributor as more components are used in the increasingly sophisticated audio and navigation systems while more suppliers are moving manufacturing plants off-shore. This paper presents a case study on how...
Proceedings Papers

ISTFA2019, ISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis, 53-59, November 10–14, 2019,
...Abstract Abstract This presentation demonstrates how Time-of-Flight Secondary Ion Mass Spectroscopy provides unique information to identify suspect counterfeit semiconductor devices. An example is shown where the epitaxial layers of a light emitting device (LED) do not match those...
Proceedings Papers

ISTFA2014, ISTFA 2014: Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis, 55-64, November 9–13, 2014,
...Abstract Abstract Possible methods for counterfeit electronic part detection can be classified into two main categories: physical inspection and electrical testing. The physical inspection techniques can potentially be extended to different integrated circuit (IC) types; however, there are some...
Proceedings Papers

ISTFA2015, ISTFA 2015: Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis, 152-153, November 1–5, 2015,
...Abstract Abstract The Society of Aerospace Engineers (SAE) AS6171 Aerospace Standard standardizes the test and inspection procedures, workmanship criteria, and minimum training and certification requirements to detect counterfeit electrical, electronic, and electromechanical parts. The standard...
Proceedings Papers

ISTFA2015, ISTFA 2015: Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis, 173-176, November 1–5, 2015,
...Abstract Abstract This presentation is chronologically-progressive to the author's ISTFA Keynote given in 2010: "Counterfeiters' Techniques: Constantly Improving to Avoid Detection - National Security Depends on Us to Keep Up". It shares, in detail, the forensic test methodologies utilized...
Proceedings Papers

ISTFA2015, ISTFA 2015: Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis, 177-178, November 1–5, 2015,
...Abstract Abstract The entire electronics industry is now facing a much more insidious counterfeit threat than at any time in the past. The existence of cloned electronic components bearing the markings of major component manufacturers in today’s global supply chains has been clearly established...
Proceedings Papers

ISTFA2015, ISTFA 2015: Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis, 189-198, November 1–5, 2015,
... be achieved in hardware, our focus will be on the latest wave of technology breakthroughs and innovation in radiography systems: algorithms. counterfeit components electronic devices failure analysis radiography systems X-ray inspection WISE%and%ICARUS:%New%X2Ray%Algorithms%to%Improve...
Proceedings Papers

ISTFA2012, ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis, 426-432, November 11–15, 2012,
...Abstract Abstract Counterfeit components have been defined as a growing concern in recent years as demand increases for reducing costs. In fact the Department of Commerce has identified a 141% increase in the last three years alone. A counterfeit is any item that is not as it is represented...
Proceedings Papers

ISTFA2012, ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis, 433-435, November 11–15, 2012,
...Abstract Abstract Counterfeiting of electronic components continues to be an evolving issue that greatly impacts many companies around the globe. And with so many initiatives that have either been enacted or are in the works, there is a significant amount of confusion and even fear in our...
Proceedings Papers

ISTFA2016, ISTFA 2016: Conference Proceedings from the 42nd International Symposium for Testing and Failure Analysis, 580-587, November 6–10, 2016,
...Abstract Abstract Counterfeiting is an increasing concern for businesses and governments as greater numbers of counterfeit integrated circuits (IC) infiltrate the global market. There is an ongoing effort in experimental and national labs inside the United States to detect and prevent...
Proceedings Papers

ISTFA2016, ISTFA 2016: Conference Proceedings from the 42nd International Symposium for Testing and Failure Analysis, 594-604, November 6–10, 2016,
...Abstract Abstract It is known by both the commercial and government suppliers, one of the best ways to guarantee the security and reliability of IC's is to image the IC directly using an x-ray microscope. These images can be inspected for many signs of counterfeit electronics. Unfortunately...
Proceedings Papers

ISTFA2017, ISTFA 2017: Conference Proceedings from the 43rd International Symposium for Testing and Failure Analysis, 79-87, November 5–9, 2017,
...Abstract Abstract Battelle has developed a technology to nondestructively classify electronic components as authentic or counterfeit. The technology uses a method that creates feature vectors for each class of devices using a reconfigurable side channel power analysis test fixture. This test...
Proceedings Papers

ISTFA2018, ISTFA 2018: Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis, 51-56, October 28–November 1, 2018,
...Abstract Abstract As counterfeiting techniques and processes grow in sophistication, the methods needed to detect these parts must keep pace. This has the unfortunate effect of raising the costs associated with managing this risk. In order to ensure that the resources devoted to counterfeit...
Proceedings Papers

ISTFA2018, ISTFA 2018: Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis, 57-63, October 28–November 1, 2018,
...Abstract Abstract Counterfeit electronics constitute a fast-growing threat to global supply chains as well as national security. With rapid globalization, the supply chain is growing more and more complex with components coming from a diverse set of suppliers. Counterfeiters are taking...
Proceedings Papers

ISTFA2018, ISTFA 2018: Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis, 64-72, October 28–November 1, 2018,
...Abstract Abstract This paper explains the CLSM technique and presents surface roughness measurement data from several groups of known authentic and suspect counterfeit parts. Surface roughness is an important characteristic of plastic encapsulated or metal lidded parts because counterfeit parts...
Proceedings Papers

ISTFA2021, ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, 12-19, October 31–November 4, 2021,
... and ORB Fully Connected Neural Networks (FCN), and Convolutional Neural Network (CNN) architectures. It also discusses edge cases where the algorithms are prone to fail and where potential opportunities exist for future work in PCB logo identification, component authentication, and counterfeit detection...
Proceedings Papers

ISTFA2021, ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, 65-72, October 31–November 4, 2021,
.... It also has the potential to be used as a region proposal algorithm for object detection networks and to facilitate sensor fusion involving artifact removal in PCB X-ray tomography. BoM extraction component identification counterfeit detection hardware assurance PCB component segmentation...
Proceedings Papers

ISTFA2011, ISTFA 2011: Conference Proceedings from the 37th International Symposium for Testing and Failure Analysis, 238-241, November 13–17, 2011,
...Abstract Abstract This abstract provides an introduction to the utility of botanical DNA taggants to provide supply chain security for electronic components and to protect against counterfeiting and diversion. A detailed treatment of the science behind Applied DNA Sciences' botanical DNA...