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Proceedings Papers

ISTFA1996, ISTFA 1996: Conference Proceedings from the 22nd International Symposium for Testing and Failure Analysis, iii, November 18–22, 1996, Los Angeles, California, USA
... Abstract Listing of the ISTFA 1996 Organizing Committee. ORGANIZING COMMITTEE Edward I. Cole, Jr. Chairman Sandia National Laboratories Albuquerque, New Mexico Shekhar Khandekar Vice Chairman Level One-Communications, Inc. Sacramento, California Seshu V. Pabbisetty Woskhop Chairman Texas...
Proceedings Papers

ISTFA1998, ISTFA 1998: Conference Proceedings from the 24th International Symposium for Testing and Failure Analysis, xiii, November 15–19, 1998, Dallas, Texas, USA
... example. Thomas W. Lee Microchip Technology Inc. 1998 ISTFA Conference General Chairman ISTFA 1998: Conference Proceedings from the 24th International Symposium for Testing and Failure Analysis November 15 November 19, 1998, Dallas, Texas, USA DOI: 10.31399/asm.cp.istfa1998fm02 Copyright © 1998 ASM...
Proceedings Papers

ISTFA2000, ISTFA 2000: Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis, xiii, November 12–16, 2000, Bellevue, Washington, USA
... Committee), ASM, and, the members of EDFAS, look forward to the future of failure analysis. Daniel L. Barton, Ph.D. Sandia National Laboratories ISTFA 2000 General Chairman bartondl@sandia.gov ISTFA 2000: Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis November...
Proceedings Papers

ISTFA1998, ISTFA 1998: Conference Proceedings from the 24th International Symposium for Testing and Failure Analysis, 79-82, November 15–19, 1998, Dallas, Texas, USA
.... Biography of Author D. David Dylis Senior Engineer/DSC Chairman IIT Research Institute Reliability Analysis Center 201 Mill St. Rome, NY 13440 USA Phone: (315) 339-7055 Fax: (315) 336-1371 Email: ddylis@rome.iitri.com David Dylis is a Senior Engineer with IIT Research Institute (IITRI) in Rome, NY...
Proceedings Papers

ISTFA2005, ISTFA 2005: Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis, iii-vi, November 6–10, 2005, San Jose, California, USA
... Semiconductor, Inc. Jeremy A. Walraven MEMS Sandia National Laboratories Kendall S. Wills Packaging; Sample Preparation Texas Instruments, Inc. ISTFA 2005 TUTORIAL COMMITTEE William E. Vanderlinde Organizing Committee Tutorial Chairman Laboratory For Physical Sciences Tutorial Committee Chair Topic Affiliation...
Proceedings Papers

ISTFA2004, ISTFA 2004: Conference Proceedings from the 30th International Symposium for Testing and Failure Analysis, iii-vi, November 14–18, 2004, Worcester, Massachusetts, USA
... 2004 TUTORIAL COMMITTEE William E. Vanderlinde Organizing Committee Tutorial Chairman Laboratory For Physical Sciences Tutorial Committee Chair Topic Affiliation Cosme Furlong Sample Preparation Worcester Polytechnic Leo G. Henry Failure Mechanisms ESD TLP Consulting/Testing Rebecca L. Holdford...
Proceedings Papers

ISTFA2011, ISTFA 2011: Conference Proceedings from the 37th International Symposium for Testing and Failure Analysis, 446-452, November 13–17, 2011, San Jose, California, USA
... counterfeits differently depending on the type of components used and the source of those components. As recorded in Electronic Design News [10], It may sound like a cliché, but it s true, says Jack Stradley (chairman of the SIA anti-counterfeiting committee). If we don t hang together, we ll all hang...