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automatic test pattern generator

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Proceedings Papers

ISTFA2019, ISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis, 160-163, November 10–14, 2019,
... (ATE). Common tests, such as scan, use patterns that are generated through Automatic Test Pattern Generator (ATPG) in compressed mode. When these patterns are looped for D-PEM, it results in indeterministic states within cells during the load or unload sequences, making interpretation of emission...
Proceedings Papers

ISTFA2019, ISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis, 419-425, November 10–14, 2019,
...Abstract Abstract This paper discusses a creative manual diagnosis approach, a complementary technique that provides the possibility to extend Automatic Test Pattern Generation (ATPG) beyond its own limits. The authors will discuss this approach in detail using an actual case – a test coverage...
Proceedings Papers

ISTFA1999, ISTFA 1999: Conference Proceedings from the 25th International Symposium for Testing and Failure Analysis, 427-438, November 14–18, 1999,
...Abstract Abstract IDDQ testing detects a majority of faults in logic ICs. To improve defect coverage with very short test patterns, IDDQ testing has been integrated in fault simulators embedded with automatic test pattern generation (ATPG) algorithms. Nevertheless, for failure analysis purposes...
Proceedings Papers

ISTFA1998, ISTFA 1998: Conference Proceedings from the 24th International Symposium for Testing and Failure Analysis, 259-266, November 15–19, 1998,
...Abstract Abstract Recent progress with IDDQ testing has demonstrated the ability to identify a majority of defects in logic ICs. IDDQ testing has also been integrated in fault simulators embedded with automatic test pattern generation (ATPG) algorithms to further extend defect coverage. However...
Proceedings Papers

ISTFA2021, ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, 377-387, October 31–November 4, 2021,
... of automatic test pattern generator (ATPG) diagnosis in order to determine the failure mechanism. This paper proposes a way to improve resolution using single-shot logic and high-resolution targeted patterns. Two cases are presented to demonstrate the approach and show how it performed on actual failing units...
Proceedings Papers

ISTFA2006, ISTFA 2006: Conference Proceedings from the 32nd International Symposium for Testing and Failure Analysis, 219-220, November 12–16, 2006,
...Abstract Abstract This article explores the use of principal component analysis (PCA) and hierarchical clustering in the analysis of wafer level automatic test pattern generation (ATPG) failure data. The principle of commonality is extended by utilizing hierarchical clustering to collect die...
Proceedings Papers

ISTFA2003, ISTFA 2003: Conference Proceedings from the 29th International Symposium for Testing and Failure Analysis, 384-390, November 2–6, 2003,
...Abstract Abstract Effort and complexity for failure analysis are increasing on state of the art logic designs. As chips become more and more complex, functional tests are not possible anymore [1] and are replaced with automatic test pattern generation (ATPG) using a full scan design approach...
Proceedings Papers

ISTFA2017, ISTFA 2017: Conference Proceedings from the 43rd International Symposium for Testing and Failure Analysis, 322-326, November 5–9, 2017,
... Logic, has greater ease and flexibility in pattern generation during fault isolation, the all programmable SoC device integrates a dual ARM Cortex-A9 cores with Programmable Logic (PL) in a single chip. The cache data access in-between processor and PL is more complex and test methodology has lesser...
Proceedings Papers

ISTFA2004, ISTFA 2004: Conference Proceedings from the 30th International Symposium for Testing and Failure Analysis, 176-180, November 14–18, 2004,
... to reach otherwise unreachable nodes, we have developed a diagnosis flow (see Figure 1) [1]. From an initial Automatic Test Pattern Generation (ATPG) and datalog tester resulting from EWS (Electrical Wafer Sort), a first diagnosis is performed to create a list of potential failing nodes. To reduce...
Proceedings Papers

ISTFA2013, ISTFA 2013: Conference Proceedings from the 39th International Symposium for Testing and Failure Analysis, 482-485, November 3–7, 2013,
... a higher success rate at subsequent physical failure analysis of complex modern RF System on a Chip. automatic test pattern generation failure analysis mobile applications radio frequency communication system on chips...
Proceedings Papers

ISTFA2018, ISTFA 2018: Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis, 481-485, October 28–November 1, 2018,
... patterns were generated automatically in [2] using a customized generator in Labview. For FA purposes, a tester can be compared to any other localization tool, which is used to reproduce the failing mode in the DUT. Patterns based logic testing on an ATE is different from testing a memory product [3...
Proceedings Papers

ISTFA2005, ISTFA 2005: Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis, 395-400, November 6–10, 2005,
.... This paper describes the necessary steps in order to set up statistical scan diagnosis, discusses the main failure analysis strategies and gives experimental results. automatic test pattern generation failure analysis fault localization integrated circuits statistical analysis Statistical...
Proceedings Papers

ISTFA2004, ISTFA 2004: Conference Proceedings from the 30th International Symposium for Testing and Failure Analysis, 172-175, November 14–18, 2004,
...) to obtain fail vector information B) ATPG (Automatic test pattern generation) tool-Fastscan to obtain failing net information C) Bridging analysis [using nearest neighbor nets to the failing net to calculate fail correlation matrix using fast scan] to check for bridge location information D) DFT (Design...
Proceedings Papers

ISTFA2010, ISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis, 384-388, November 14–18, 2010,
... / schematic visualizer. The net s color in layout and schematic is aligned to the suspect s line color in the diagnosis GUI. Debug-Friendly Test Pattern Generation Based on the scan diagnosis result additional diagnosis pattern are generated using the ATPG (Automatic Test Pattern Generation) tool. This can...
Proceedings Papers

ISTFA2020, ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis, 261-263, November 15–19, 2020,
.... First electrical verification has been performed on the ATE (Automatic Test Equipment). ATPG (Automatic Test Pattern Generation) patterns were able to catch the failure. The part has been retested with ATPG pattern customized for failure analysis. Generation of customized ATPG pattern for failure...
Proceedings Papers

ISTFA2021, ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, 334-336, October 31–November 4, 2021,
... sensor, sensitive to wavelengths from 1µm up to 1.55µm. Available optical lenses are 20x, 50x, 100x and SIL. PEM analysis has been performed, while looping automatic test pattern generation (ATPG) patterns through TESEDA Work Bench. The part was failing for chain integrity, so one reduced pattern has...
Proceedings Papers

ISTFA2001, ISTFA 2001: Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis, 459-464, November 11–15, 2001,
... of failure exists in the device Once failure data is successfully recorded, it must be converted to a form suitable for fault diagnosis tools (usually associated with automatic test pattern generation, or ATPG, software). This process is highly complex and error-prone. The vendor (or author, if internal...
Proceedings Papers

ISTFA2020, ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis, 61-66, November 15–19, 2020,
... increasing too much turn-around time. Finally, two case studies have been described to demonstrate how the electrical probing results guide the follow-up physical failure analysis to find the defect. 14nm SOI microprocessors automatic test pattern generation electrical probing failure analysis fin...
Proceedings Papers

ISTFA2003, ISTFA 2003: Conference Proceedings from the 29th International Symposium for Testing and Failure Analysis, 506-513, November 2–6, 2003,
... of the maximum instantaneous current. Because of the assumption that all input signals are independent, this estimated maximum current for most circuits represents a loose upper bound for most circuits. Timed Automatic Test Pattern Generation (ATPG), probability-based and integer linear programming (ILP...
Proceedings Papers

ISTFA2021, ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, 369-376, October 31–November 4, 2021,
... that demonstrate the usefulness of the proposed method. automatic test pattern generator cell-aware fault model stuck-at faults transition delay faults user-defined fault model ISTFA 2021: Proceedings from the 47th International Symposium for Testing and Failure Analysis Conference October 31...