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Zener diodes

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Proceedings Papers

ISTFA1998, ISTFA 1998: Conference Proceedings from the 24th International Symposium for Testing and Failure Analysis, 353-357, November 15–19, 1998,
...Abstract Abstract Failure analysis and finite-element analysis were used in conjunction to determine the cause of zener diode failures. A mechanical/plasma depot method was developed for the plastic-encapsulated SMB package and used to observe the presence of remelted extruded solder material...
Proceedings Papers

ISTFA2013, ISTFA 2013: Conference Proceedings from the 39th International Symposium for Testing and Failure Analysis, 452-455, November 3–7, 2013,
... mode was also present at ambient temperature. In Failure Analysis (FA) lab a standard analysis flow: static EMMI (Fig.1), optical inspection (Fig.2), microprobing and deprocessing down to the Silicon (Fig.3) allowed us to localize damaged devices (Zener diodes) and to correlate these results...
Proceedings Papers

ISTFA2001, ISTFA 2001: Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis, 125-129, November 11–15, 2001,
... integrated circuit had leakage associated with the electrostatic discharge circuits. The electrostatic discharge protection on the pads was one of the sources of leakage. The focused ion beam tool was used to isolate the zener diode from the silicon control rectifier circuit. The silicon control rectifier...
Proceedings Papers

ISTFA2021, ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, 29-33, October 31–November 4, 2021,
... actual damaged components from the composite signature. For example, the transistor often parallels with a Zener diode to protect from overvoltage as shown in Figure 3; both breakdown in the Zener diode with a good transistor, or breakdown in the transistor with a good Zener diode may produce the same...
Proceedings Papers

ISTFA2008, ISTFA 2008: Conference Proceedings from the 34th International Symposium for Testing and Failure Analysis, 273-276, November 2–6, 2008,
... line for the FMON (fail monitoring) block. IV sweeps across the Zener diode showed a leakage (Figures 4 and 5). This Zener diode triggers the protection block to be active and caused the device to fail. Although the diode is leaking at room temperature, it is just close to the limit. The leakage gets...
Proceedings Papers

ISTFA2017, ISTFA 2017: Conference Proceedings from the 43rd International Symposium for Testing and Failure Analysis, 73-78, November 5–9, 2017,
... 8: PCA distributions of microcontrollers with different memory sizes and date codes. Figure 9: Optical images of 32 kB and 16 kB NXP microcontrollers; the same die type is used for both microcontrollers. Aging Detection Fig. 10 shows the normalized PSA spectra of a representative Zener diode before...
Proceedings Papers

ISTFA1996, ISTFA 1996: Conference Proceedings from the 22nd International Symposium for Testing and Failure Analysis, 41-46, November 18–22, 1996,
... constructed in polysilicon with multiple junctions. Both forward biased and reverse biased Zener-like junctions were used in series to result in a near zero temperature coefficient Because the diode current was low and the junction area high, it was questioned whether the current density was high enough...
Proceedings Papers

ISTFA2015, ISTFA 2015: Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis, 270-273, November 1–5, 2015,
... leakage which was hard defect-induced, the EMMI result was a precious guidance to the root cause. Layout and schematic was studied based on the abnormal missing emitted spots at cold temperature. It was found that they were located on two series Zener diodes (DZ5 and DZ4) which are involved in wake up...
Proceedings Papers

ISTFA2014, ISTFA 2014: Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis, 350-357, November 9–13, 2014,
... of opposite polarity, in an abutting connection will create a chain of Zener diodes with a very low breakdown voltage. The bidirectional structure yields a Zener in series with a diode irrespective of voltage polarity. When a voltage occurs that equals or exceeds the Zener breakdown (VZ) it conducts...
Proceedings Papers

ISTFA2017, ISTFA 2017: Conference Proceedings from the 43rd International Symposium for Testing and Failure Analysis, 456-463, November 5–9, 2017,
... is from a 180 nm technology with deep trench isolation for high power domains for an automotive application. The EBIC sense probe was placed on the anode of the structure (a Zener diode), with the ground probe on the cathode. This yielded comparable results to the junction stain, highlighting each main...
Proceedings Papers

ISTFA2021, ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, 352-358, October 31–November 4, 2021,
... the performance of an integrated circuit (IC), especially in analog/mixed signal devices. At onsemi, we had encountered a poor P-N junction of a Zener diode that caused a Cross-Coupled-Switched-Cap voltage doubler to have a lower output voltage which eventually affected the performance of the IC. The integrity...
Proceedings Papers

ISTFA2004, ISTFA 2004: Conference Proceedings from the 30th International Symposium for Testing and Failure Analysis, 609-612, November 14–18, 2004,
... Proceedings from the 30th International Symposium for Testing and Failure Analysis November 14 November 18, 2004, Worcester, Massachusetts, USA DOI: 10.31399/asm.cp.istfa2004p0609 The emission sites at diodes D0 and D1 were identified to be reverse biased zeners and were due to the failure mode (the PEM sites...
Proceedings Papers

ISTFA2000, ISTFA 2000: Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis, 231-234, November 12–16, 2000,
..., Simon Keeton, Kent Kime, Ruth Ruiz, Chuck Reed, Gene Thome, Mechanical/Plasma Decapsulation Method and Thermal Finite-Element Analysis Provide Explanation for SMB Zener Failures 24th International Symposium for Testing and Failure Analysis pp. 353-358 (1998) 2. M.J. Declercq, L. Gerzberg, and J.D...
Proceedings Papers

ISTFA2004, ISTFA 2004: Conference Proceedings from the 30th International Symposium for Testing and Failure Analysis, 120-125, November 14–18, 2004,
... of the Zener breakdown mechanism. This concept has the advantage of not sacrificing area consumption, although it is increasing process complexity by the addition of an extra mask for PESD implantation. This article is organized in three parts: a detailed description of the investigated devices...