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Proceedings Papers

ISTFA2012, ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis, 183-189, November 11–15, 2012,
...Abstract Abstract In this paper, we describe improved hardware to connect a semiconductor tester or applications board to a laser scanning microscope (LSM) for performing dynamic laser stimulation (DLS). The hardware, called DXGlue, simplifies the DLS workflow and enables new applications. We...
Proceedings Papers

ISTFA2016, ISTFA 2016: Conference Proceedings from the 42nd International Symposium for Testing and Failure Analysis, 561-563, November 6–10, 2016,
...Abstract Abstract In most of the non-destructive electrical fault isolation cases, techniques such as DLS, Photon Emission, LIT, OBIRCH indicate a fault location directly. But relying on just one of these techniques for marginal failure mechanism is not enough for better fault localization...
Proceedings Papers

ISTFA2009, ISTFA 2009: Conference Proceedings from the 35th International Symposium for Testing and Failure Analysis, 52-59, November 15–19, 2009,
...Abstract Abstract Limitations of backside optical techniques for failure analysis of dynamically activated devices have underlined the need to extend the capabilities of Dynamic Laser Stimulation techniques (DLS). DLS techniques provide a precise localization of the dynamically failing area...
Proceedings Papers

ISTFA2017, ISTFA 2017: Conference Proceedings from the 43rd International Symposium for Testing and Failure Analysis, 196-200, November 5–9, 2017,
... of logic laid out in silicon has made it difficult to precisely fault isolate using a conventional continuous wave laser which has a laser spot size of about ~300nm. Also, the remnant effects of a CW laser DLS like banding due to n-well interactions make it further difficult to achieve high resolution...
Proceedings Papers

ISTFA2008, ISTFA 2008: Conference Proceedings from the 34th International Symposium for Testing and Failure Analysis, 188-192, November 2–6, 2008,
...Abstract Abstract This paper presents the use of Dynamic Laser Stimulation (DLS) and Time-Resolved DLS (TR-DLS) to provide fail site localization and complementary information on a failed embedded memory IC. In this study, an embedded dual port RAM within a 90nm IC that failed one of the Memory...
Proceedings Papers

ISTFA2014, ISTFA 2014: Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis, 307-311, November 9–13, 2014,
...Abstract Abstract Dynamic Laser Stimulation (DLS) technique have met with great success over the past few years in helping failure analysis engineer to tackle different type of soft failures. DLS is widely applied to devices presenting an abnormal behavior for any electrical parameter...
Proceedings Papers

ISTFA2017, ISTFA 2017: Conference Proceedings from the 43rd International Symposium for Testing and Failure Analysis, 390-397, November 5–9, 2017,
... Stimulation (DLS) which is widely used in the industry for effective identification of subtle failure mechanisms and soft defects especially for AC signal-related failures [1, 2]. However, for analysis of some complex AMS IC failure modes, the tool’s standard setup may not always be compatible...
Proceedings Papers

ISTFA2010, ISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis, 217-223, November 14–18, 2010,
...Abstract Abstract Dynamic Laser Stimulation (DLS) techniques proved to be very efficient in soft defect localization bringing a lot of information about the device internal behavior. We need to use external parameter measurements such as frequency, delay, voltage etc to perform these techniques...
Proceedings Papers

ISTFA2019, ISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis, 179-181, November 10–14, 2019,
...]. Soft-Defect Localization / Dynamic Laser Stimulation (SDL/DLS) can also be applied on soft (Vmin) row/column fails for further isolation [2]. However, some failures do not have abnormal emission spots or DLS sensitivity and require different localization techniques. Laser Voltage Imaging (LVI...
Proceedings Papers

ISTFA2015, ISTFA 2015: Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis, 241-244, November 1–5, 2015,
...Abstract Abstract In the case of conventional planar FET, Dynamic Laser Stimulation (DLS) is a very effective method to isolate marginal failure. Depending on laser sources, DLS is divided by Soft Defect Localization (SDL) and Laser Assisted Device Alteration (LADA). SDL uses 1320nm wavelength...
Proceedings Papers

ISTFA2003, ISTFA 2003: Conference Proceedings from the 29th International Symposium for Testing and Failure Analysis, 371-377, November 2–6, 2003,
... through the applied test pattern pass/fail status. This paper presents the methodology to move from static to dynamic laser stimulation. The application of such Dynamic Laser Stimulation (DLS) techniques is illustrated on dynamically failed microcontrollers. dynamic laser stimulation failure...
Proceedings Papers

ISTFA2009, ISTFA 2009: Conference Proceedings from the 35th International Symposium for Testing and Failure Analysis, 234-241, November 15–19, 2009,
... cases where no passive voltage contrast was observed at the SEM and no leakage was observed at AFM, yet the units failing SBF DG, SBF DL and depletion, were detected by nanoprobing of the single bit. The major finding of this paper is a way to resolve data gain, data loss, and depletion failures...
Proceedings Papers

ISTFA2009, ISTFA 2009: Conference Proceedings from the 35th International Symposium for Testing and Failure Analysis, 278-282, November 15–19, 2009,
... considerably. The classical Dynamic Laser Stimulation (DLS) techniques showed some limitations when applied to analog & mixedmode ICs. The SDL (Soft Defect Localization) technique [1] based on binary output signal allows us to localize only the most sensitive areas. The defect in this type of circuits...
Proceedings Papers

ISTFA2010, ISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis, 332-337, November 14–18, 2010,
...Abstract Abstract Dynamic Laser Stimulation (DLS) fault isolation techniques involve using an Automated Test Equipment (ATE) to run the device under certain test patterns together and a scanning laser beam to localize sites sensitive to laser stimulation. Such techniques are proven effective...
Proceedings Papers

ISTFA2011, ISTFA 2011: Conference Proceedings from the 37th International Symposium for Testing and Failure Analysis, 158-163, November 13–17, 2011,
...Abstract Abstract Dynamic Laser Stimulation (DLS) techniques for Soft Defect Localization (SDL) have been well documented for logic devices [1][2]. More recent literature has broadened the traditional SDL pass/fail mapping by employing multiple device parameters including power analysis [3...
Proceedings Papers

ISTFA2005, ISTFA 2005: Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis, 106-114, November 6–10, 2005,
...Abstract Abstract In this paper we report on the application field of Dynamic Laser Stimulation (DLS) techniques to Integrated Circuit (IC) analysis. The effects of thermal and photoelectric laser stimulation on ICs are presented. Implementations, practical considerations and applications...
Proceedings Papers

ISTFA2016, ISTFA 2016: Conference Proceedings from the 42nd International Symposium for Testing and Failure Analysis, 51-54, November 6–10, 2016,
... test-loop requirements in general and gives Advantest 93k specific guidelines on test-pattern release and ATE setup necessary to enable the most established EFA techniques such as LVP and SDL (aka DLS, LADA) within the XTR test architecture. automated test equipment design for testing laser...
Proceedings Papers

ISTFA2017, ISTFA 2017: Conference Proceedings from the 43rd International Symposium for Testing and Failure Analysis, 214-220, November 5–9, 2017,
...Abstract Abstract Critical speed path analysis using Dynamic Laser Stimulation (DLS) technique has been an indispensable technology used in the Semiconductor IC industry for identifying process defects, design and layout issues that limit product speed performance. Primarily by injecting heat...
Proceedings Papers

ISTFA2021, ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, 20-22, October 31–November 4, 2021,
...Abstract Abstract In the NAND flash manufacturing process, thousands of internal electronic fuses (eFuse) are tuned in order to optimize performance and validity. In this paper, we propose a machine learning optimization technique that uses deep learning (DL) and genetic algorithms (GA...
Proceedings Papers

ISTFA1996, ISTFA 1996: Conference Proceedings from the 22nd International Symposium for Testing and Failure Analysis, 127-132, November 18–22, 1996,
... to Observe #2: short (s-a-1) Hard to Observe #2: (bridge) Hard to Observe #2: (bridge) # Failing Patterns 84 158 128 128 151 219 4 1000 4 860 109 238 5 1131 195 264 Not detected 151 128 Not detected Size(s) of EquivClasses 84(dl), 5 (dl) 158(dl),9(dl) 128 (dl), (dl) 128(dl), 9(dl) 56(dl), 9(dl) 128(dl),9(dl...