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Proceedings Papers

Machine Learning in Semiconductor Failure Analysis: Techniques and Case Studies

Michael Kögel, Sebastian Brand, Frank Altmann
ISTFA2024, ISTFA 2024: Tutorial Presentations from the 50th International Symposium for Testing and Failure Analysis, v1-v120, October 28–November 1, 2024,
https://doi.org/10.31399/asm.cp.istfa2024tpv1
Abstract
Presentation slides for the ISTFA 2024 Tutorial session “Machine Learning in Semiconductor Failure Analysis: Techniques and Case Studies.”
View Papertitled, Machine Learning in Semiconductor Failure Analysis: Techniques and Case Studies View PDF for content titled, Machine Learning in Semiconductor Failure Analysis: Techniques and Case Studies
Proceedings Papers

AI-Driven Advancements in Image Processing, Analysis and 3D Modeling for Fault Isolation and Failure Analysis

Flavio Cognigni, Heiko Stegmann, Anton du Plessis, Domenico Mello, Marco Rossi ...
ISTFA2024, ISTFA 2024: Tutorial Presentations from the 50th International Symposium for Testing and Failure Analysis, w1-w82, October 28–November 1, 2024,
https://doi.org/10.31399/asm.cp.istfa2024tpw1
Abstract
Presentation slides for the ISTFA 2024 Tutorial session “AI-Driven Advancements in Image Processing, Analysis and 3D Modeling for Fault Isolation and Failure Analysis.”
View Papertitled, AI-Driven Advancements in Image Processing, Analysis and 3D Modeling for Fault Isolation and Failure Analysis View PDF for content titled, AI-Driven Advancements in Image Processing, Analysis and 3D Modeling for Fault Isolation and Failure Analysis
Proceedings Papers

Charged Particle Systems—Fundamentals and Opportunities (2024 Update)

Edward L. Principe
ISTFA2024, ISTFA 2024: Tutorial Presentations from the 50th International Symposium for Testing and Failure Analysis, x1-x68, October 28–November 1, 2024,
https://doi.org/10.31399/asm.cp.istfa2024tpx1
Abstract
Presentation slides for the ISTFA 2024 Tutorial session “Charged Particle Systems—Fundamentals and Opportunities (2024 Update).”
View Papertitled, Charged Particle Systems—Fundamentals and Opportunities (2024 Update) View PDF for content titled, Charged Particle Systems—Fundamentals and Opportunities (2024 Update)
Proceedings Papers

Atom Probe Tomography: Introduction and Applications to SEMI

Katherine P Rice
ISTFA2024, ISTFA 2024: Tutorial Presentations from the 50th International Symposium for Testing and Failure Analysis, y1-y55, October 28–November 1, 2024,
https://doi.org/10.31399/asm.cp.istfa2024tpy1
Abstract
Presentation slides for the ISTFA 2024 Tutorial session “Atom Probe Tomography: Introduction and Applications to SEMI.”
View Papertitled, Atom Probe Tomography: Introduction and Applications to SEMI View PDF for content titled, Atom Probe Tomography: Introduction and Applications to SEMI
Proceedings Papers

Fundamental Considerations in the Justification, Design and Construction of an Analytical Laboratory for High Tech Imaging and Processing Tools (2024 Update)

Steven Herschbein, Cheryl Hartfield, Michael Wong
ISTFA2024, ISTFA 2024: Tutorial Presentations from the 50th International Symposium for Testing and Failure Analysis, z1-z46, October 28–November 1, 2024,
https://doi.org/10.31399/asm.cp.istfa2024tpz1
Abstract
Presentation slides for the ISTFA 2024 Tutorial session “Fundamental Considerations in the Justification, Design and Construction of an Analytical Laboratory for High Tech Imaging and Processing Tools (2024 Update).”
View Papertitled, Fundamental Considerations in the Justification, Design and Construction of an Analytical Laboratory for High Tech Imaging and Processing Tools (2024 Update) View PDF for content titled, Fundamental Considerations in the Justification, Design and Construction of an Analytical Laboratory for High Tech Imaging and Processing Tools (2024 Update)