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Tian Xia
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Proceedings Papers
ISTFA2004, ISTFA 2004: Conference Proceedings from the 30th International Symposium for Testing and Failure Analysis, 52-57, November 14–18, 2004,
Abstract
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Abstract Light Emission due to Off-State Leakage Current (LEOSLC) is used in combination with the Picosecond Imaging Circuit Analysis (PICA) method to effectively diagnose and localize defects in a broken scan chain. As usual, the emission base method shows to be very effective in debugging the problem; the defect is successfully identified by the optical technique and confirmed by Physical Failure Analysis (PFA).
