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Min-Feng Ku
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Proceedings Papers

3DIC Fault Isolation Using the OBIRCH Approach

Ming-Sung Hsu, Yian-Liang Kuo, Yu-Ting Lin, Ru-Ying Huang, Min-Feng Ku ...
ISTFA2011, ISTFA 2011: Conference Proceedings from the 37th International Symposium for Testing and Failure Analysis, 60-63, November 13–17, 2011,
https://doi.org/10.31399/asm.cp.istfa2011p0060
Abstract
Abstract This paper uses an interesting specific case study to highlight the non-destructive fault isolation demonstration of 3DIC stacked dies applied the optical beam induced resistance change (OBIRCH) approach.
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