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M. Simard-Normandin
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Proceedings Papers
ISTFA2019, ISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis, 53-59, November 10–14, 2019,
Abstract
PDF
Abstract This presentation demonstrates how Time-of-Flight Secondary Ion Mass Spectroscopy provides unique information to identify suspect counterfeit semiconductor devices. An example is shown where the epitaxial layers of a light emitting device (LED) do not match those of the exemplar. Keywords: Secondary Ion Mass Spectroscopy, SIMS, counterfeit detection, LED, Light emitting diode.
Proceedings Papers
ISTFA2018, ISTFA 2018: Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis, 64-72, October 28–November 1, 2018,
Abstract
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Abstract This paper explains the CLSM technique and presents surface roughness measurement data from several groups of known authentic and suspect counterfeit parts. Surface roughness is an important characteristic of plastic encapsulated or metal lidded parts because counterfeit parts are often blacktopped or re-polished and remarked.