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Proceedings Papers

A Case Study of Failure Analysis on ESD-Induced Degradation of 405 nm LD

Hongmin Liu, Zhe Li, Zheng Weng, Hao Jiang, Yuanting Shen
ISTFA2015, ISTFA 2015: Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis, 227-229, November 1–5, 2015,
https://doi.org/10.31399/asm.cp.istfa2015p0227
Abstract
Abstract A field failing Ondax’s 405nm Laser Diode (LD) was under failure analysis. The failure analysis (FA) results showed that the LD was very sensitive to ESD and the degradation was ESD induced. Some mechanism explanation is also given in this paper.
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