Yield Basics for Failure Analysts

Dave Albert;

Dave Albert

IBM (Ret.)

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Tracy Myers

ON Semiconductor

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Paper No: istfa2024tpb1, pp. b1-b68; 68 pages

https://doi.org/10.31399/asm.cp.istfa2024tpb1

Published Online: October 28 2024

Abstract

Presentation slides for the ISTFA 2024 Tutorial session “Yield Basics for Failure Analysts.”

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2024

ASM International