Transmission Electron Imaging AND Diffraction in an SEM (aka, STEM-in-SEM): What, Why, and How To Do This in Your Microscope

Holm, Jason

doi:10.31399/asm.cp.istfa2024tpq1

ISTFA 2024

October 28–November 1, 2024

San Diego, California, USA

Conference Sponsors:

ISTFA 2024: Tutorial Presentations from the 50th International Symposium for Testing and Failure Analysis

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Transmission Electron Imaging AND Diffraction in an SEM (aka, STEM-in-SEM): What, Why, and How To Do This in Your Microscope

Jason Holm

National Institute of Standards and Technology

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Boulder, Colorado

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Paper No: istfa2024tpq1, pp. q1-q58; 58 pages

https://doi.org/10.31399/asm.cp.istfa2024tpq1

Published Online: October 28 2024

Abstract

Presentation slides for the ISTFA 2024 Tutorial session “Transmission Electron Imaging AND Diffraction in an SEM (aka, STEM-in-SEM): What, Why, and How To Do This in Your Microscope.”

diffraction, scanning electron microscopy, scanning transmission electron microscopy

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2024

ASM International

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Transmission Electron Imaging AND Diffraction in an SEM (aka, STEM-in-SEM): What, Why, and How To Do This in Your Microscope

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Transmission Electron Imaging AND Diffraction in an SEM (aka, STEM-in-SEM): What, Why, and How To Do This in Your Microscope

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