Review of Scanning Probe Microscopy Methods for Failure Analysis (2024 Update)

ISTFA 2024

October 28–November 1, 2024

San Diego, California, USA

Conference Sponsors:

PROCEEDINGS PAPER

Peter De Wolf

Bruker Nano Surfaces & Metrology

,

Santa Barbara CA, USA

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Paper No: istfa2024tpl1, pp. l1-l52; 52 pages

https://doi.org/10.31399/asm.cp.istfa2024tpl1

Published Online: October 28 2024

Abstract

Presentation slides for the ISTFA 2024 Tutorial session “Review of Scanning Probe Microscopy Methods for Failure Analysis (2024 Update).”

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2024

ASM International

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